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Method for measuring group delay by using wavelet transformation

A wavelet transform, delay dispersion technology, applied in the field of interferometry, can solve the problems of large group delay dispersion and refractive index coefficient errors, errors, oscillations, etc., to achieve the effect of fewer calculation steps, improved accuracy, and simplified measurement process

Inactive Publication Date: 2010-03-03
NAT INST OF METROLOGY CHINA +1
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Problems solved by technology

In the process of numerical calculation, due to the influence of phase fluctuation or noise, large errors and oscillations are often caused in the process of phase derivation, resulting in large errors in the measured group delay, group delay dispersion and refractive index coefficient

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  • Method for measuring group delay by using wavelet transformation
  • Method for measuring group delay by using wavelet transformation
  • Method for measuring group delay by using wavelet transformation

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0026] The present invention proposes a new, simple and accurate group delay measurement method, through the combined analysis of the measured interference time and frequency, the group delay can be directly obtained from the instantaneous period of the interference at the local frequency, without the need to calculate the phase and For phase derivation, the influence of errors and oscillations in the phase derivation process is eliminated, not only the process is simple, but also the accuracy is greatly improved.

[0027] First the realization principle of the present invention is described below:

[0028] The white light interferometer uses white light as the light source and uses the standard Macchelson interferometer ...

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Abstract

The invention discloses a method for measuring group delay by using wavelet transformation, which comprises the following steps of: performing the wavelet transformation on a measured interference signal; detecting the ridge of the wavelet transformation; and using the ridge of the wavelet transformation as the group delay to obtain the group delay. The method, through the conjoint analysis of a measured interference time frequency, can directly obtain the group delay from a transient cycle interfered at a local frequency, does not need to calculate the phase and carry out derivation, eliminates the influences caused by errors and oscillations in the phase deriving process, and effectively improves the precision of measuring the group delay.

Description

technical field [0001] The invention relates to the technical field of interferometric measurement in optics, in particular to a method for measuring group delay by using wavelet transform, which can further realize the measurement of group delay dispersion and refractive index coefficient. Background technique [0002] White light interferometry technology is currently an effective method for measuring group delay, group delay dispersion and group refractive index coefficient of optical materials and optical devices, and can measure group delay, group delay dispersion and group refractive index coefficient in a wide spectral range. [0003] There are two methods of white light interferometry, the time domain method and the frequency domain method. The time-domain method is to use the displacement device to reciprocate at a certain position to scan the time-domain interference fringes of the signal. The accuracy of the result calculation is affected by the linearity of the d...

Claims

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Application Information

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IPC IPC(8): G01N21/45G01M11/02
Inventor 邓玉强张志刚杨暐健于靖
Owner NAT INST OF METROLOGY CHINA
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