Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Precise registration method of multilook point cloud

A precise registration and multi-view technology, applied in image data processing, instrumentation, computing, etc., can solve problems such as poor accuracy

Inactive Publication Date: 2010-02-10
BEIJING INFORMATION SCI & TECH UNIV
View PDF0 Cites 75 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Barequet G, Sharir M (Partial surface matching by using directed foot Prints. Computational Geometry: Theory and Applications, 1999, 12(1-2): 45-62) proposed a voting matching mechanism algorithm based on geometric hash technology, using The normal vector attached to the feature point is used as a directional footmark for local surface registration. The registration process is simple and fast, but the accuracy is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Precise registration method of multilook point cloud
  • Precise registration method of multilook point cloud
  • Precise registration method of multilook point cloud

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[0016] figure 1 is a flowchart of a method for precise registration of multi-view point clouds according to an embodiment of the present invention.

[0017] refer to figure 1 , in step 101, read the two global point clouds M and N to be registered, and select a point cloud that roughly overlaps with each other from the point clouds M and N as the target point cloud P(N P points) and reference point cloud Q(N Q points). The pre-registration of the point cloud is realized by using the principal direction fitting method, so that the two point clouds are unified into the pivot coordinate system (ie, the principal axis coordinate system described below).

[0018] The ICP algorithm requires that the relative initial positions of the point clouds to be registered should not differ too much, otherwise, the convergence direction of the ICP algorithm is uncertain, w...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a precise registration method of multilook point cloud, comprising the following steps: respectively selecting one piece of point cloud overlapping approximately from two piecesof global point cloud to be registered to serve as the target point cloud and the reference point cloud; utilizing a principle direction bonding method to realize the preregistration of the target point cloud and the reference point cloud; utilizing the principle direction test method to judge and realize the consistency of the preregistration principle directions of the target point cloud and the reference point cloud; respectively calculating the curvature of each point in the target point cloud and the reference point cloud; respectively obtaining characteristic matching point symetries P0and Q0 according to curvature similarity; using the iterative closest point matching algorithm to realize the precise registration of the target point cloud and the reference point cloud by utilizingthe characteristic matching point symetries P0 and Q0; and completing the registration of the two pieces of global point cloud. The method is characterized by high computation speed and high registration precision, thus being capable of realizing good registration effect.

Description

technical field [0001] The invention relates to computer vision measurement, which belongs to the technical field of computer graphics. Specifically, the invention relates to a method of converting three-dimensional data scanned at different angles and positions into a unified coordinate system, thereby automatically reconstructing a complete three-dimensional model of an object Methods. Background technique [0002] An important part of reverse engineering is to combine data under structured light multi-view measurement. Because the size of the product often exceeds the measuring range of the measuring device, and in some areas, the measuring probe cannot touch the back of the product, so the usual three-dimensional measuring system can only obtain data on a certain direction and a certain area on the surface of the measured object at a time. point. Therefore, to obtain complete shape information of an object, multi-view is generally used, that is, detection is performed ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
Inventor 吕乃光唐辉娄小平韩建栋
Owner BEIJING INFORMATION SCI & TECH UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com