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Functional test method, terminal device and system based on memory apparatus

A storage device and functional testing technology, which is applied in branch office equipment, electronic circuit testing, electrical measurement, etc., can solve problems such as inability to guarantee product quality, incomplete functional coverage, low efficiency, etc. The effect of easy operation

Active Publication Date: 2009-07-22
HUAWEI DEVICE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantages of manual testing are: low efficiency, many stations, high cost, and incomplete functional coverage, etc., so that product quality cannot be guaranteed

Method used

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  • Functional test method, terminal device and system based on memory apparatus
  • Functional test method, terminal device and system based on memory apparatus
  • Functional test method, terminal device and system based on memory apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0023] figure 1 It is a schematic diagram of a terminal device with a functional testing device based on a storage device according to an embodiment of the present invention Figure 1 . The terminal device 100 having a functional testing device based on a storage device includes a test identification unit 101 and a test unit 102, the test identification unit 101 is used for the device under test to send test identification information to the storage device according to a preset testability design, Identifying whether the agreed test information exists in the storage device; if the agreed test information exists in the storage device, the testing unit 102 is configured to perform a functional test on the device under test according to the agreed test information and generate test result data.

[0024] In a preferred embodiment, the terminal device with the storage device-based functional testing device further includes a test result data sending unit, which is configured to se...

Embodiment 2

[0033] image 3 It is a schematic diagram of a storage device-based functional testing method according to an embodiment of the present invention. The methods include:

[0034]Step S301: Send the test identification information to the storage device according to the preset testability design, and identify whether the agreed test information exists in the storage device; the agreed test information includes: identifying whether the agreed test file exists in the storage device And identifying whether there is test information agreed with the storage device in the test file;

[0035] Step S302: If the agreed test information exists in the storage device, perform a functional test according to the agreed test information and generate test result data, and then send the identification result data to the storage device for storage.

[0036] Sending the test identification information to the storage device according to the preset design for testability includes: performing testabi...

Embodiment 3

[0046] Figure 7 It is a schematic diagram of a functional test system based on a storage device according to an embodiment of the present invention Figure 1 . The system 700 includes a storage device 701 and a device under test 702, wherein the storage device 701 is used to store a test file for testing the device under test; the device under test 702, according to a preset testable The specific design sends the test identification information to the storage device to identify whether there is agreed test information in the storage device, and if there is agreed test information in the storage device, perform a functional test according to the agreed test information and generate a test result data, the device under test sends the recognition result data to the storage device for storage.

[0047] In a preferred embodiment, the commissioning terminal of the storage device-based functional testing system is used to inquire whether the storage device has established a commun...

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PUM

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Abstract

The invention provides a functional test method, terminal device and system based on storage device. The method comprises: sending test identifying information to the storage device according to predetermined design for testing, identifying whether there is promissory test information in the storage device; if so, processing functional test and generating test result data according to the promissory test information. The invention processes automated functional test for product by host computer interfaces of the storage device. A commissioning terminal can send test information to the storagedevice real-time to realize real-time communication of the commissioning terminal and the tested device. The invention is characterized in complete functional cover, good quality assurance, high testefficiency, low cost and convenient test operation.

Description

technical field [0001] The present invention relates to the functional testing technology of electronic products, specifically a storage device-based functional testing method, terminal equipment and system. Background technique [0002] Functional testing is an important quality inspection link in the process of electronic product processing. It can help manufacturers to inspect most of the components with poor incoming materials and poor assembly and processing. Functional testing is based on production, with the main purpose of checking product hardware failures, and it also has functions such as configuring product manufacturing information. In the course of realizing the present invention, the inventor finds that there are at least the following problems in the prior art: [0003] For the aesthetics of the whole machine, and limited by the size of the whole machine, there are fewer and fewer interfaces in consumer electronics products, and even some products no longer ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04M1/24G01R31/02G01R31/28
Inventor 李杰
Owner HUAWEI DEVICE CO LTD
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