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Uniaxial crystal birefringence measuring method

A birefringence, uniaxial crystal technology, applied in the direction of transmittance measurement, measuring devices, instruments, etc., can solve the problems of difficult processing, low precision, limited measurement accuracy, etc., to achieve multi-wavelength measurement, instrument and equipment Complex, easy-to-achieve effects

Inactive Publication Date: 2008-05-28
SHANDONG UNIV
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

For example, the traditional minimum deflection angle method measures n o and n e Find the birefringence of the crystal, measure n o and n e The accuracy can reach 5 effective digits. However, due to the minimum deviation angle method, the crystal must be processed into a prism, which is difficult to process and requires a large crystal. In actual work, the crystal size that can be grown from many crystals is very small. At the millimeter level, it is not feasible to use this method to measure; the interference fringe overlapping method can directly measure the crystal birefringence, but the measurement accuracy is limited by the light intensity measurement accuracy for judging the overlap of two sets of fringes, the measurement is more complicated, and the accuracy is also low. not tall

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Examples

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Embodiment 1

[0034] Example 1: Device for Measuring Uniaxial Crystal Birefringence

[0035] Present embodiment, as shown in Figure 1, comprises double-beam spectrophotometer, and it is made of light source 1, monochromator 2, beam splitter 3 and five mirrors 4,5,10,11 and 12, photomultiplier tube 13 and Computer configuration; light source 1 is located in front of monochromator 2, beam splitter 3 and five mirrors 4, 5, 10, 11 and 12 are located behind monochromator 2, and monochromatic light emitted from monochromator 2 passes through beam splitter Device 3 and two mirrors 4 and 5 therein form two parallel optical paths, and then the light beams of the two optical paths are collected to photomultiplier tube 13 by another three mirrors 10, 11 and 12, behind photomultiplier tube 13 Connected to a computer, it is characterized in that a polarizer 7 and an analyzer 9 are sequentially placed in one of the two optical paths, a diaphragm 6 is placed in the other optical path, and the light source...

Embodiment 2

[0036] Embodiment 2: A kind of measuring method of uniaxial crystal birefringence

[0037] As shown in Figure 1, the steps are as follows:

[0038] a. cutting the strontium barium niobate (SBN) crystal doped with cesium into wafer samples 8 along the z direction;

[0039] b. In one optical path of the double-beam spectrophotometer, put the polarizer 7 and the polarizer 9, and rotate the polarizer 9 to make its vibration transmission direction parallel to that of the polarizer 7;

[0040] c. A diaphragm 6 is placed on the other optical path, and the aperture size of the diaphragm 6 can be adjusted;

[0041] d. Determination of the benchmark: adjust the monochromator 2 to decompose the continuous spectrum emitted by the light source (bromine tungsten lamp) 1 into monochromatic light, and then divide it into two light paths via a beam splitter 3 and two reflectors 4 and 5 The two beams of light in the above step b change from natural light to linearly polarized light after pass...

Embodiment 3

[0045] Embodiment 3: A kind of measuring method of uniaxial crystal birefringence

[0046] As shown in Figure 1, the steps are as follows:

[0047] a. cutting the strontium barium niobate (SBN) crystal doped with cesium into wafer samples 8 along the z direction;

[0048] b. In one optical path of the double-beam spectrophotometer, put the polarizer 7 and the polarizer 9, and rotate the polarizer 9 to make its vibration transmission direction parallel to that of the polarizer 7;

[0049] c. A diaphragm 6 is placed on the other optical path, and the aperture size of the diaphragm 6 can be adjusted;

[0050] d. Determination of the benchmark: adjust the monochromator 2 to decompose the continuous spectrum emitted by the light source (bromine tungsten lamp) 1 into monochromatic light, and then divide it into two light paths via a beam splitter 3 and two reflectors 4 and 5 The two beams of light in the above step b change from natural light to linearly polarized light after pass...

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Abstract

The invention discloses a method for measuring uniaxial crystal birefringence rates and belongs to the crystal material measuring technology, which comprises adopting a double-beam spectrophotometer and a polarizing and polaroid analyzer, using a bromine lamp which can emit ultraviolet and visible light as a light source, measuring out continuously transmission spectrums of the uniaxial crystal, obtaining corresponding wave lengths according to the transmission spectrums of the uniaxial crystal, and thereby obtaining the uniaxial crystal birefringence rate. The measuring method has simple operation, simple employing instrument and equipment, the uniaxial crystal birefringence rate can be rapidly calculated out through the transmission spectrums, and the invention is easy to be realized in a lab. On the other side, the uniaxial crystal birefringence rate value in a certain spectrum range can be obtained through the transmission spectrums, and multi-wavelength measurements of uniaxial crystal birefringence rate value can be realized.

Description

Technical field: [0001] The invention relates to the measurement technology of crystal materials, in particular to a method for measuring the birefringence index of uniaxial crystals. Background technique: [0002] The birefringence properties of crystals have been widely used in the field of polarization, modulation and nonlinear optics of light, so the birefringence of crystals (n o -n e ) measurement is very important. There are several methods available to obtain the birefringence of crystals. For example, the traditional minimum deflection angle method measures n o and n e Find the birefringence of the crystal, measure n o and n e The accuracy can reach 5 effective digits. However, due to the minimum deviation angle method, the crystal must be processed into a prism, which is difficult to process and requires a large crystal. In actual work, the crystal size that can be grown from many crystals is very small. At the millimeter level, it is not feasible to use thi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/59G01N21/17G06F17/10
Inventor 连洁魏爱俭王青圃
Owner SHANDONG UNIV
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