Method of testing radio frequency hardware module

Abstract

The invention discloses a method for testing a radio-frequency hardware module. The method comprises dividing each test task of the radio-frequency hardware module into a plurality of test subtasks in the test process. During the test task, the test subtasks are executed in order, if the current test subtask is executed successfully, the next test subtask is executed; when the test subtask is overtime or abnormal, the test task is terminated immediately, and a current test task mark, a current test subtask mark and the corresponding fault information are output at the same time. The test method for the radio-frequency hardware module, provided in the invention, divides each test task into a plurality of the test subtasks, which has the advantages that a user can efficiently control the test and obtain important test information during the test process; and that the method realizes the rapid fault location and facilitates the maintenance and transplantation of programs.

Description

technical field [0001] The invention relates to a testing technology of a hardware module, in particular to a testing method of a radio frequency hardware module. Background technique [0002] With the rapid development of society, radio frequency technology has been widely used and recognized in communication, medical, aerospace and other industries, and radio frequency technology is gradually playing a huge role in various products. As a component of various products, RF hardware modules must undergo strict and comprehensive testing in order to meet the requirements of the products. Compared with the test of the digital hardware module, the test of the radio frequency hardware module has greater complexity. The radio frequency hardware module not only needs to carry out various tests of the hardware of the radio frequency hardware module itself, but more importantly, it needs to test various radio frequency indicators to be completed by the radio frequency hardware module...

AI Technical Summary

Problems solved by technology

[0003] However, the RF indicator test of the RF hardware module generally includes the test of multiple RF indicators, that is, multiple test tasks, and some test tasks are complex, the test program is huge, difficult to maintain and poor in portability, and complex test tasks take a long time , even takes 10 to 20 minutes. If the user performs operations such as test pause and test information reading during the test process, the test process can only respond to user control after executing the currently executing test task, resulting in the user being unable to Effective control of the test process, unable to obtain important test information in time, such as the current test progress, time spent, etc.

[0004] At the same time, the testing methods and procedures for some radio frequency indicators are quite complicated. If a fault is detected in the radio frequency hardware module, it will take a long time to locate the fault

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