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Ultrasonic inspection configuration with beam overlap verification

a technology of ultrasonic inspection and beam overlap, applied in the direction of instruments, measurement devices, scientific instruments, etc., can solve problems such as the relative chaos of the way

Inactive Publication Date: 2018-08-16
OLYMPUS SCI SOLUTIONS AMERICAS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent describes a method and apparatus for verifying the overlap of adjacent beams in a probe configuration used for inspection of a test object. The method uses predetermined relationships between the overlap percentage and the intersection amplitudes of adjacent plots to verify that the overlap percentage at a specified amplitude drop is greater than a predetermined threshold. The technical effect of this method is that it provides a reliable and accurate way to verify the actual overlap of adjacent beams without being influenced by the order in which the data is acquired.

Problems solved by technology

During calibration, the beam response is usually acquired without an encoder system, and in a relatively chaotic way.

Method used

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  • Ultrasonic inspection configuration with beam overlap verification
  • Ultrasonic inspection configuration with beam overlap verification
  • Ultrasonic inspection configuration with beam overlap verification

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Embodiment Construction

[0022]FIG. 1 shows a schematic flow chart of the overlap verification process during a calibration, which is to be carried out with prior knowledge of the actual geometry for a subsequent measurement on a test object 28. In order to provide suitable ultrasonic beams, a scan plan module 2, having information about a weld geometry 4, is used to generate a beam definition 12, which comprises a definition of N ultrasonic beams having M pairs of adjacent beams. Scan plan module 2 further defines a suitable probe 6, a wedge 8 and a calibration block 10. While probe 6 is generating ultrasonic beams according to scan plan module 2, probe 6 and wedge 8 are manually scanned on the surface of calibration block 10. Acoustic response signals received by probe 6 are directed to a data acquisition unit 14 where the signals are digitized. ACG and TCG calibrations are applied to the digital data by an ACG / TCG application unit 15, and the calibrated data is passed to a beam relevance module 18. Calib...

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Abstract

Disclosed is a beam overlap verification system and method for phased array ultrasonic inspection. A scan plan for the ultrasonic inspection defines a suitable probe, wedge and calibration block having machined defects for the geometry to be inspected, and makes a beam definition which defines a set of ultrasonic beams emitted by the phased array. An intersection amplitude unit records the response amplitudes from each defect at predetermined intersection points of adjacent beam pairs as the probe and wedge are manually scanned across the calibration block. An overlap verification module determines the −6 dB overlap of all adjacent beam pairs which are relevant to the geometry to be inspected, and verifies that the beam overlap conforms to the required coverage according to the ASME or other relevant codes. In this way, coverage is experimentally verified during calibration prior to inspection of a known geometry, such as a weld.

Description

FIELD OF THE INVENTION[0001]The present disclosure generally relates to a method and a system for conducting non-destructive testing / inspection (NDT / NDI) by phased array ultrasonic testing (PAUT), and more particularly to a system and method of creating a scan plan with validation of the overlap of ultrasonic beams of a PAUT configuration.BACKGROUND OF THE INVENTION[0002]Phased array ultrasonic testing (PAUT) is an advanced method of ultrasonic testing that has applications in industrial non-destructive testing (NDT). Common applications are to find flaws in manufactured materials such as welds.[0003]Single-element (non-phased array) probes, known technically as monolithic probes, emit a beam in a fixed direction. To test a large volume of material, a conventional probe must be physically moved or turned to sweep the ultrasonic beam through the area of interest.[0004]In contrast, the beam from a PAUT probe can be moved electronically, without moving the probe, and can be swept throu...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01N29/30G01N29/26
CPCG01N29/262G01N29/30G01N29/043G01N29/4427
Inventor LEPAGE, BENOIT
Owner OLYMPUS SCI SOLUTIONS AMERICAS
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