Measuring probe used in particular for measuring the length of thin layer
A technology for measuring probes and thin layers, which is applied in the field of measuring probes, can solve the problems of improving the measurement accuracy of measuring probes, and achieve the effects of improving accuracy, simple installation, and reducing friction
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[0031] FIG. 1 shows a measuring probe 11 for measuring the thickness of thin layers, which is used in a device not shown in detail. The measuring probe 11 is used for the non-destructive measurement of thin layer thicknesses. According to the exemplary embodiment, this measuring probe 11 is provided detachably to the device for measuring the thickness of the thin layer and is able to transmit the recorded measured values via the connection line 12 . Alternatively, the measuring probe 11 can be part of a device for measuring the thickness of a thin layer in the form of a stationary device or a manual device.
[0032] The measuring probe 11 comprises a housing 14 which is designed in particular to be cylindrical. On the longitudinal axis 16 of the housing 14 at least one sensor element 17 is preferably arranged. The sensor element 17 is supported by a holding member 18 received by an end portion 19 of the housing 14 . At least on one sensor element 17 , along the longitudin...
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