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Fast test and analysis method and device for luminous characteristics of material sample room

A technology for fast analysis and luminescence characteristics, applied in the direction of material excitation analysis, electric excitation analysis, etc., can solve problems such as time-consuming and impractical screening work, achieve rapid screening and improve research speed

Inactive Publication Date: 2005-11-23
UNIV OF SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If conventional testing methods are used to test and analyze each sample on the material sample library one by one, it will take a long time and make the screening work impractical

Method used

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  • Fast test and analysis method and device for luminous characteristics of material sample room
  • Fast test and analysis method and device for luminous characteristics of material sample room
  • Fast test and analysis method and device for luminous characteristics of material sample room

Examples

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Embodiment 1

[0033] Embodiment 1 A rapid analysis and testing method for the luminescence characteristics of a material sample library on a material sample library. First, all samples on the material sample library are excited by the excitation source of the material luminescent light wave, so that each sample on the material sample library is excited Generate luminous light waves, and after optical imaging, use an optical recorder to record the light waves emitted by each sample on the material sample library. Specifically, an excitation light source can be used to irradiate all samples on the entire photoluminescent material sample library at the same time to excite The photoluminescent light wave of each sample on the sample library can also use the excitation power supply to load the electric field to all the samples on the entire electroluminescent material sample library to excite the electroluminescent light wave of each sample on the sample library. The excitation electron beam scan...

Embodiment 2

[0034] Embodiment 2 A rapid analysis and testing device for the luminescence characteristics of materials on a material sample library, which consists of a material luminescent light wave excitation source, a sample holder 6, an imaging lens 10 and an optical recorder 12, and a material sample library is placed on the sample holder 6 The material luminescent light wave excitation source, the sample holder 6, the imaging lens 10 and the optical recorder 12 are arranged on the workbench, and the imaging lens 10 and the optical recorder 12 are located on the optical path of the luminescent light wave generated by the sample after being excited by the excitation source, specifically In other words, the material luminescence light wave excitation source is the excitation light source; or the material luminescence light wave excitation source is the excitation power supply, the bracket for fixing the combined material sample library is placed on the sample holder 6, and the electrodes...

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Abstract

The method includes exciting all the samples in the material sample library with the exciting source of the material light-emitting waves to make every sample produce excited light wave; imaging optically; and recording the reverse light waves of the samples with optical recorde. The device consists of light emitting wave exciting source, sample holder, imaging lens and optical recorder; all the said parts are set on bench; and the imaging lenss and the optical recorder are located in the optical path of the light emitting wave produced by the excited samples. The present invention makes it possible to fast judge the light emitting performance of samples in material sample library and to screen out excellent formula of light emitting material.

Description

technical field [0001] The invention belongs to a method and a device for analyzing and testing the luminescence characteristics of materials, and mainly relates to a method and a device for rapidly analyzing and testing the luminescence characteristics of a material sample library. Background technique [0002] Combinatorial methods are a new approach for materials research. When using this method to screen new materials, a large number of material samples with different components can be prepared on a substrate each time to form a large and dense array of material samples, that is, a material sample library (also known as: material chip). In such a combined material sample library, not only the size of each sample is small (perhaps a film with an area of ​​less than 1 square millimeter and a thickness of less than 1 micron), but also a large number of samples (up to 1000, or even 10,000), density Very high (up to 100-1000 samples / cm²). In order ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/62G01N21/63G01N21/66
Inventor 高琛刘小楠崔宏滨
Owner UNIV OF SCI & TECH OF CHINA
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