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Beam remittance automatic measurement and particle beam focusing automatic regulating method

An automatic adjustment and automatic measurement technology, applied in radiation/particle processing, instruments, electrical digital data processing, etc., can solve problems such as unseen combination, and achieve the effect of improving beam quality and reducing collision opportunities.

Inactive Publication Date: 2005-10-19
INST OF PLASMA PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is no method and device that combines detection and focusing and performs automatic control at the same time.

Method used

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  • Beam remittance automatic measurement and particle beam focusing automatic regulating method
  • Beam remittance automatic measurement and particle beam focusing automatic regulating method
  • Beam remittance automatic measurement and particle beam focusing automatic regulating method

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Embodiment Construction

[0010] Beam emittance measurement can adopt pepper screen method or OTR method, measuring instrument (device) [2] of the present invention, it is connected with input data controller (device) [4], input data controller [4] is controlled by A / The A / D converter is used to convert the measured lateral emission electrical signal into a digital signal of the computer. The sensor is to accept the instruction of the computer [6] to drive the mechanical transmission device to work, and to drive the measuring instrument [2 ] to enter or exit the beam pipe. Focusing lens [3] can adopt quadrupole lens, single lens etc., and it is connected with output data controller [5], and output data controller [5] comprises D / A converter and sensor, and D / A converter is computer [6] The digital signal is converted into an electrical signal, and the electromagnetic parameters of the focusing lens are controlled by the sensor to achieve automatic focus adjustment. Specific measurement and adjustment...

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PUM

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Abstract

Comparing with previous research, the invention combines measuring and focusing beam flux. Computer (PC) controls automatic measuring and focusing. Computer sends the measuring commands, reads data, obtains parameters of transmittance, from which the beam flux parameter and focusing parameter are obtained through calculation. The focusing parameter is passed to focusing device (lens) in order to improve quality of beam flux. As the quality of beam flux is raised, the chance of collision between beam flux and viewfinder is reduced. The beam spot will reduced to 2-3 mum or even less. The invention can be applied to monitoring beam flux and improving quality of beam in accelerator automatically, especially the device needed of small beam spot as well as ion optics, electron optics and particle accelerator.

Description

Technical field: [0001] The invention belongs to the fields of radiation biology, ion optics, electron optics and particle accelerators. Background technique: [0002] In the field of radiation biology, accurate positioning is a very important technology in the single-particle microbeam system for targeted irradiation of cells. In order to accurately position and irradiate cells, the beam spot at the exit of the aimer of the single-particle micro-beam system must be reduced to a certain degree. At present, the common method in all countries in the world is to use collimators with apertures on the order of microns, which can generally obtain beam spots with a diameter of 5-10 μm. The diameter is basically around 5 μm. In order to further reduce the exit beam spot of the single particle beam device, it is necessary to study and discuss the beam quality optimization of the single particle beam device and the reasons that affect the beam quality. There are many factors affect...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F7/00G06F9/44G21K1/00
Inventor 吴瑜余增亮王绍虎胡素华陈斌张束清李军吴李君
Owner INST OF PLASMA PHYSICS CHINESE ACAD OF SCI
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