Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-dimensional synthetic aperture radar registration method and device

A synthetic aperture radar, multi-dimensional technology, applied in the direction of measuring devices, image analysis, instruments, etc., can solve problems such as the influence of registration accuracy, different antenna phase centers, and matching failure of registration technology, so as to improve registration accuracy and weaken The effect of geometric distortion

Pending Publication Date: 2022-08-09
AEROSPACE INFORMATION RES INST CAS
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the research on registration is mainly aimed at the same band. Due to the difference in scattering characteristics and geometric differences of ground objects in different bands, the registration technology directly starting from the image often fails to match, while the registration technology processed from the imaging process is limited to a certain range. One band, only the antenna phase center is different, and the registration accuracy is affected by DEM accuracy and error compensation approximation processing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-dimensional synthetic aperture radar registration method and device
  • Multi-dimensional synthetic aperture radar registration method and device
  • Multi-dimensional synthetic aperture radar registration method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] The present invention will be described in detail below with reference to the accompanying drawings and embodiments.

[0063] The invention is a multi-dimensional synthetic aperture radar registration method and device, which obtains system parameters of different bands, and performs space-time consistency processing in the imaging process based on the spatial geometric relationship of the antenna phase center, so as to realize multi-dimensional SAR multi-band image matching. allow.

[0064] like Figure 1-2 As shown, the multi-dimensional synthetic aperture radar registration method includes:

[0065] Step S1: Obtain the multi-band echo data set I={I obtained by the multi-dimensional synthetic aperture radar (SAR) system in one flight 1 ,...,I r ,...,I num }; Use the internal calibration data in the echo data to calculate the sampling delay correction value of each band; Use the position and attitude data to generate the reference trajectory of each band; Based on ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multi-dimensional synthetic aperture radar registration method and device, which are used for carrying out consistency processing on signals in an imaging process to realize multiband consistency imaging. The method comprises the following steps: selecting a reference wave band, and obtaining distance offset and azimuth offset of each wave band relative to the reference wave band based on the antenna phase center position of each wave band, a reference track and a reference drift angle of each wave band; performing range direction signal resampling, range direction frequency spectrum band-pass filtering and range direction signal interception to obtain processed range pulse pressure data; carrying out azimuth resampling, frequency spectrum band-pass filtering and azimuth signal interception to obtain a processed SAR image; checking the registration precision between each wave band image and the reference wave band image by using the scaling points; and if the registration precision is greater than one pixel, correcting the distance offset and azimuth offset of each non-reference wave band image relative to the reference wave band by using the scaling points.

Description

technical field [0001] The invention relates to the technical field of multi-band synthetic aperture radar data processing, in particular to a multi-dimensional synthetic aperture radar registration method and device. Background technique [0002] Synthetic Aperture Radar (SAR), as an active remote sensing technology, has the ability of all-day and all-weather earth observation, and has important application potential in the fields of natural resource monitoring, topographic mapping, forest biomass estimation and so on. With the continuous development of SAR technology, SAR has expanded from single-polarization to multi-polarization, and from single-band to multi-band, and systems with simultaneous observation capabilities in multiple dimensions such as multi-band and multi-polarization continue to emerge. For example, the German F-SAR has the ability to acquire full-polarization data in five bands of P, L, S, C, and X; the domestic multi-dimensional SAR has the ability to s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/90G01S7/41G06T7/30
CPCG01S13/9021G01S7/41G06T7/30
Inventor 王亚超汪丙南周良将丁赤飚
Owner AEROSPACE INFORMATION RES INST CAS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products