Experimental method for conductor conductivity research

Abstract

The invention relates to the technical field of conductive performance research, in particular to an experimental method for conductor conductive performance research, which comprises the following steps: S1, conductor preparation: selecting a proper material according to a test requirement, crushing a solid material, pouring the crushed material and a liquid material into grinding equipment, and grinding to obtain slurry, the preparation method comprises the following steps: preparing slurry, then detecting the concentration of an internal material of the slurry, diluting the slurry as required after the detection is finished so as to obtain slurry with different concentrations, finally spraying the slurry on a prepared substrate by using vacuum coating equipment, and drying by using drying equipment. The method has the beneficial effects that secondary conductivity testing can be performed on the conductor in the Hall testing step, so that the conductivity testing precision of the conductor is improved, and the electrochromic material contained in the conductor can change color during testing, so that a tester can more intuitively know the conductivity of the conductor according to the shade of the color.

Description

technical field [0001] The invention relates to the technical field of conductive property research, in particular to an experimental method for conducting conductive property research. Background technique [0002] The conductivity of a material refers to the migration of carriers (electrons, holes, ions) in a solid under the action of an electric field, which is one of the most important transport properties of a substance. Among the many physical properties of materials, electrical conductivity is very important. For example, conductive materials, resistance materials, electrothermal materials, semiconductor materials, insulating materials, and superconducting materials are all classified based on the electrical conductivity of materials. [0003] Chinese Patent No. CN105445636A is a semiconductor test circuit and a method for detecting the conductivity of a test piece. The test circuit includes: the tested object is connected in series with the switch; a resistor is con...

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Problems solved by technology

[0005] The purpose of the present invention is to provide an experimental method for the research of the electrical conductivity of a conductor, so as to solve the problems of low test accuracy of the electrical conductivity of the existing conductor and the inability to visually represent the testing process proposed in the above-mentioned background technology

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