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Two-dimensional sample plate line segment offset method based on control point

A technology of control points and line segments, which is applied in the field of clothing design, can solve problems such as offset and inability to control contour lines or internal lines, and achieve the effects of reducing repetitive work, realistic model effects, and controlling offset

Pending Publication Date: 2022-04-08
上海百琪迈科技(集团)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Its principles and models cannot solve the problem of controlling contour line or internal line offset encountered in the field of clothing design

Method used

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  • Two-dimensional sample plate line segment offset method based on control point
  • Two-dimensional sample plate line segment offset method based on control point

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Embodiment Construction

[0022] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for ease of description, only parts related to the invention are shown in the drawings.

[0023] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0024] The two-dimensional template line segment offset method based on control points, including two steps of control point offset and line segment offset,

[0025] Such as figure 1 As shown, the control point offset includes the following steps,

[0026] S1. Set several control points to be of...

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Abstract

The invention discloses a two-dimensional sample plate line segment offset method based on control points, which comprises two steps of control point offset and line segment offset, the control point offset comprises the following steps: S1, setting a plurality of control points to be offset, S2, acquiring a line segment formed by adjacent control points, and calculating an offset value by using a displacement function SHV (P), y1, calculating the offset of each control point on the angular bisector, Y2, determining the offset direction of each control point according to the offset orientation, Y3, correcting each key point, taking left and right adjacent points of the key points as intersection points to correct the key points, calculating offset values among all line segments through a displacement function SHV (P) after data of the key points are obtained, and determining the offset direction of each control point according to the offset direction; y4, checking whether line segments formed by the key points are intersected or not; and comparing the offset value with the line segment offset value until all disjoint offset values are obtained. Through calculation and intersection comparison of the control points and the offset line segments, the offset of the contour line or the internal line is effectively controlled, so that the model effect is more vivid.

Description

technical field [0001] The invention relates to the field of clothing design, in particular to a two-dimensional model line segment offset method based on control points. Background technique [0002] In fashion design, two-dimensional sample editing provides the most direct way to modify the size and size of garment pieces in the process of sample making by related software. The difference between the display of two-dimensional samples and three-dimensional samples is that when dealing with two-dimensional samples, more structural information is attached to each sample. When expressing the template contour line (or internal graphic line), a special line segment structure representation is required, which contains the basic point information and key control point information on the line segment. The key points (or called control points) are "drawn" The skeleton of a sample, or the key shape of an internal graphic line, and the rest of the point information describes the sha...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T11/20G06F30/10G06F113/12
Inventor 袁小燕
Owner 上海百琪迈科技(集团)有限公司
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