Raman spectrum peak identification method for optimizing wavelet algorithm

A wavelet algorithm and Raman spectroscopy technology, applied in the field of analytical instruments, can solve the problems of low spectral peak recognition accuracy and peak position positioning accuracy, and achieve reduction of root mean square error, good noise reduction method, and suppression of false Gibbs The effect of the phenomenon

Pending Publication Date: 2022-01-25
BEIJING INSTITUTE OF TECHNOLOGYGY
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method needs to determine the ridge length threshold and the ridge signal-to-noise ratio threshold, and the accuracy of spectral peak identification and peak location accuracy is not high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Raman spectrum peak identification method for optimizing wavelet algorithm
  • Raman spectrum peak identification method for optimizing wavelet algorithm
  • Raman spectrum peak identification method for optimizing wavelet algorithm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] Specific embodiments of the present invention are provided below, but the present invention is not limited to the examples provided.

[0038] In order to test the advantages and disadvantages of these various identification methods, the present invention uses simulated Raman spectra with different noise levels to verify their performance. The spectral peaks of the simulated Raman spectrum of the present invention are all simulated by Gaussian functions. The simulated Raman spectrum contains a total of six spectral peaks, including three isolated peaks and three overlapping peaks, and the spectral signal-to-base ratio is 1, such as figure 2 As shown, a certain amount of Gaussian noise has been added to the spectrum, and the peak parameters are shown in Table 1.

[0039] Table 1 Simulation Raman Spectroscopy Parameters

[0040] Peak position (cm -1 )

654 1090 1535 2130 2200 2270 Peak height 3 6 9 6 6 6 Width at half maximum 25 30 ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a Raman spectrum peak identification method for optimizing a wavelet algorithm, in particular to an unknown article Raman spectrum peak identification detection and Raman spectrum peak wavelet algorithm analysis and identification method, and belongs to the field of analysis instruments.

Description

technical field [0001] The invention relates to a method for identifying Raman spectrum peaks with an optimized wavelet algorithm, in particular to a Raman spectrum peak identification method for unknown objects and an analysis and identification method for Raman spectrum peak wavelet algorithms, and belongs to the field of analytical instruments. Background technique [0002] As an effective detection and analysis method, spectral analysis technology is an important part of modern analysis technology and is widely used in the field of public security. Raman scattering spectroscopy is a technology gradually developed in the 1920s. Raman spectroscopy has been valued by the majority of researchers due to its advantages of non-destructive, rich information, and no need for sample preparation. Raman spectrum information is contained in Raman spectrum peaks, so Raman spectrum peak identification is a crucial link in the qualitative analysis of Raman spectrum. [0003] Wavelet an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/65G06F17/14G06F17/15
CPCG01N21/65G06F17/148G06F17/15
Inventor 刘吉平韩佳王银杰
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products