Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A press-fitting device for a semiconductor device and a pressure detection method thereof

A press-fitting device and semiconductor technology, applied in semiconductor/solid-state device manufacturing, measuring devices, force/torque/power measuring instruments, etc. Reduce and other problems, to avoid the effective pressure reduction, reduce the manual operation torque, improve the effect of accuracy

Active Publication Date: 2022-06-03
ZHUZHOU CSR TIMES ELECTRIC CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the crimping force required by the semiconductor device is small (such as below 80kN), the press-fitting device can complete the crimping of the semiconductor device by tightening the bolt with a torque wrench with a certain torque; but as the crimping force required for the semiconductor device increases ( Such as more than 100kN), the torque wrench is often unable to achieve the required crimping force. At this time, a press is required, and usually a large press-fitting force will force the upper and lower pressure plates to deform after the external pressure is released, making the semiconductor device The actual pressure attenuation does not meet the application requirements of the device. At this time, the internal components of the semiconductor device cannot be reliably contacted, which directly affects the performance of the semiconductor device.
[0003] At the same time, semiconductor devices such as high-power thyristors are usually affected by external factors such as external vibrations, switch shocks, temperature changes, and failure of butterfly springs during the process of press-fitting and putting into use, resulting in a gradual decrease in the effective press-fitting force of semiconductor devices. , when the effective press-fitting force is reduced beyond the required pressure range, it will inevitably affect the performance of the device, cause damage to the device, and cause problems such as failure to work.
However, when a semiconductor device fails, the residual pressure of the semiconductor device will often disappear with the dismantling of the device, and the residual pressure result calculated by the disassembly torque is often due to the change of external factors such as the friction coefficient, resulting in the calculated The result deviates a lot from the actual residual pressure, and it is impossible to obtain accurate actual residual pressure of the semiconductor device, and it is also impossible to judge whether the effective press-fitting force is within the required pressure range, so it is impossible to guarantee the best performance of the semiconductor device.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A press-fitting device for a semiconductor device and a pressure detection method thereof
  • A press-fitting device for a semiconductor device and a pressure detection method thereof
  • A press-fitting device for a semiconductor device and a pressure detection method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments of the description, but it does not

[0040] FIGS. 1 to 6 show an embodiment of a press-fitting device for a semiconductor device of the present invention, which is applied to press-fitting

[0041] As shown in FIG. 1 and FIG. 2, the pressure plate tooling includes an upper positioning member 4 and a lower positioning member 5. Among them, the upper positioning member 4 is provided with an upper

[0043] The structure of the upper platen limit portion 42 and the lower platen limit portion 52 of the present invention and the setting position are based on the positioning member.

[0049] In this embodiment, the adjustment components 3 are four groups, and the four groups of the adjustment components 3 are respectively arranged at the four corners of the lower pressure plate 2 of the upper pressure plate 1.

[0051] As shown in FIG. 6 , the low...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a press-fitting device of a conductor device and a pressure detection method thereof. The upper positioning part of the press-fitting device is provided with an upper pressing plate force application part and an upper pressing plate limiting part, which are arranged in a staggered manner along the circumference of the upper positioning part; the lower positioning part is provided with a lower pressing plate force applying part and a lower pressing plate limiting part, and the lower pressing plate limiting The position part is arranged on the outer periphery of the force application part of the lower platen, and the force force part of the upper platen and the force force part of the lower platen respectively abut against the upper platen and the area where the adjustment assembly is arranged on the upper platen. The detection method includes setting a pressure detection piece in the semiconductor device; determining the actual effective pressure value of the semiconductor device; determining the pressure value of the press; repeating the above steps, changing the pressure value of the press, and measuring the actual effective pressure value corresponding to the pressure value of the different press and Press the pressure value of the press to obtain a linear relationship; obtain the actual effective pressure value of the semiconductor device. The invention has the advantages of ensuring effective press-fitting of semiconductor devices, accurate detection of actual effective pressure values, and convenient operation.

Description

A press-fitting device for a semiconductor device and a pressure detection method thereof technical field The present invention relates to the field of power electronic semiconductor device pressing, in particular to a pressing device for semiconductor devices and its pressure detection method. Background technique At present, the pressing device of the existing semiconductor device usually consists of an upper pressing plate, a lower pressing plate, a tightening screw and other elastic Support accessories, etc. When the crimping force required for the semiconductor device is small (such as below 80kN), the crimping device uses a torque wrench Tightening the bolts with a certain torque can complete the press-fitting of semiconductor devices; however, as the crimping force required for semiconductor devices increases Large (such as more than 100kN), the required crimping force cannot be achieved by using a torque wrench. The large pressing force will force the uppe...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01L5/00H01L21/67
CPCG01L5/0047G01L5/008H01L21/67121
Inventor 高原马振宇郭航飞王才孝许汝波李幼保刘建平李先强王桂华
Owner ZHUZHOU CSR TIMES ELECTRIC CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products