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A Trigger Method Based on Oscilloscope Measurement Parameters

A technology for measuring parameters and oscilloscopes, which is applied in the direction of measuring devices, measuring electrical variables, instruments, etc., and can solve the problems that the description of waveform characteristics is not intuitive and accurate, and the extraction of target waveforms is not accurate enough.

Active Publication Date: 2021-09-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these trigger methods are not intuitive and accurate enough to describe the waveform characteristics in actual use, resulting in inaccurate extraction of target waveforms

Method used

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  • A Trigger Method Based on Oscilloscope Measurement Parameters
  • A Trigger Method Based on Oscilloscope Measurement Parameters
  • A Trigger Method Based on Oscilloscope Measurement Parameters

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Experimental program
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Embodiment

[0045] figure 1 DETAILED DESCRIPTION is a flowchart illustrating the method for triggering the oscilloscope measurements of the parameters of the present invention. like figure 1 It is shown, based on the specific steps of the method for triggering the oscilloscope measurement parameters of the present invention comprises:

[0046] S101: signal sampling:

[0047] Oscilloscope acquisition module ADC input analog signal, the ADC sampling data obtained.

[0048] S102: level comparison:

[0049] Set high level according to the actual value V H And a low value V L , And the ADC sampling data high and low values, determines rising and falling edges of the input analog signal. figure 2 Is a schematic view of the rising and falling edges is determined according to the high, low value.

[0050] S103: Select trigger mode:

[0051] According to actual needs in the selection of one alternative embodiment to trigger the trigger mode, the trigger alternative embodiment comprises a periodic tri...

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PUM

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Abstract

The invention discloses a trigger method based on oscilloscope measurement parameters. First, the ADC acquisition data is collected, and the ADC acquisition data is compared with preset high and low level values ​​to determine the rising edge and falling edge of the input analog signal, and then Select a trigger method in the alternative trigger methods. The alternative trigger methods include three types: time parameter trigger, amplitude parameter trigger, and combination parameter trigger. Different trigger methods use different trigger judgment methods. Each trigger method Both use the measurement parameters of the oscilloscope directly as the trigger conditions. When the trigger conditions are met, a trigger signal is generated to control the storage and reading operation of the ADC sampling data, thereby completing the parameter trigger function of the oscilloscope. The invention uses the measurement parameters of the oscilloscope directly as the trigger condition, thereby more intuitively and accurately describing the characteristics of the target waveform, helping the user to find out the target waveform part more conveniently and quickly, and is also convenient for the user to understand.

Description

Technical field [0001] The present invention belongs to the technical field of digital storage oscilloscope, and more particularly, to a method of triggering the measurement parameters based on the oscilloscope. Background technique [0002] Trigger condition is displayed in the user panel of the oscilloscope settings and a stable waveform, the waveform of interest to the user is the feature recognition essence, is one of the important functions of a digital storage oscilloscope. Generally divided into basic oscilloscope trigger edge triggered mode, and pulse width, the slope and other characteristics of the advanced trigger recognition. Domestic oscilloscope late start, relatively speaking, the trigger system is also relatively junior, on the part of the oscilloscope advanced triggering aspect has been gradually catch up with the level of foreign countries, but the main drawback is that the same function with respect to foreign products more monotonous, efficiency is low. [000...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R13/02
CPCG01R13/0254
Inventor 张沁川黄鲭萤叶芃邱渡裕黄武煌
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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