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Arbitrary intensity combination test case generation method

A technology of combined testing and test cases, applied in software testing/debugging, error detection/correction, instruments, etc.

Active Publication Date: 2021-02-26
BEIJING INST OF COMP TECH & APPL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0014] The purpose of the present invention is to provide a method for generating test cases with any combination of strengths, which solves the problem that the system parameters to be tested have different combination coverage strength requirements in the current combination test

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  • Arbitrary intensity combination test case generation method
  • Arbitrary intensity combination test case generation method
  • Arbitrary intensity combination test case generation method

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Embodiment Construction

[0030] In order to make the purpose, content, and advantages of the present invention clearer, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0031] The method for generating arbitrary strength combination test cases of the present invention includes:

[0032]The present invention adopts the following methods and steps to realize the generation of the minimum coverage table of arbitrary intensity: the first step is to calculate the scale of the complete set of test cases under the full combination of the parameters of the system to be tested and the mixed system corresponding to the test cases according to the value of the system parameters to be tested Count the weights of each position, and then quickly generate a complete set of test cases by converting the decimal integers within the scale into mixed base numbers; the second step is to convert the test ca...

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Abstract

The invention relates to an arbitrary strength combined test case generation method, which comprises the following steps of: 1, generating a combined test case complete set; 2, mapping a use case identification vector; 3, selecting test cases, setting an initial cumulative vector as a zero vector, calculating the weight and dispersion of each test case, performing weighting to obtain a target function value, obtaining the test case with the maximum target function value, adding an identification vector corresponding to the case into the cumulative vector, wherein the calculation of the weightand the dispersion depends on the bit operation between the identification vectors; and 4, judging whether the coverage table meets the coverage requirement or not through the accumulation vector, ifso, screening out the minimum coverage table by adjusting the weights of the weight and the dispersion, otherwise, returning to the step 3, and continuing to select the test cases. According to the invention, the generation of the minimum coverage table of any intensity can be realized.

Description

technical field [0001] The invention relates to software testing technology, in particular to a method for generating test cases with arbitrary strength combinations. Background technique [0002] Mandl carried out Combination Interactive Testing (CIT) on the Ada compiler by using the experimental method of orthogonal Latin squares. Since then, the concept of combination testing has been introduced into software testing, and the research on combination testing for different coverage standards has been greatly enriched by later generations. The connotation of combined testing is clarified. Based on three defect analysis reports, Kuhn drew the famous conclusion that generations of combinatorial testing researchers are proud of, that is, paired combinatorial testing can detect 70% of the defects caused by the interaction between the parameters of the system under test. For software defects, the three-way combined coverage test can detect 90% of the defects, and the 6-way combi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684Y02D30/70
Inventor 靳龙龙高艳鹍宋晓秋
Owner BEIJING INST OF COMP TECH & APPL
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