Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

On-line nondestructive thickness measuring device for advanced-generation substrate glass

A thickness measurement and glass technology, applied in the field of high-generation substrate glass online non-destructive thickness measurement device, can solve the problems of reducing product yield, proportional increase, affecting the cleanliness of glass surface, etc., to reduce measurement difficulty, high accuracy, Efficient effect

Inactive Publication Date: 2021-01-15
BENGBU CHINA OPTOELECTRONIC TECH CO LTD
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Glass middle point measurement is very difficult
[0005] 2. When manually measuring the glass surface, it is inevitable to touch the glass surface. The clean surface after surface grinding will be slightly scratched after contact with an ultrasonic thickness measuring instrument, which will affect the cleanliness of the glass surface and eventually reduce the product yield.
[0006] 3. Manual measurement of glass thickness is time-consuming and laborious. It takes about 30 minutes to measure nine points at a time in the existing production line, and it takes 60 minutes to measure each before and after surface grinding.
If more points are measured on a single panel, the time-consuming will increase proportionally

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • On-line nondestructive thickness measuring device for advanced-generation substrate glass
  • On-line nondestructive thickness measuring device for advanced-generation substrate glass

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] Such as figure 1 As shown, the present invention provides an online non-destructive thickness measurement device for high-generation substrate glass, which includes a mounting bracket 2 arranged above the glass transmission roller 1, the mounting bracket 2 is perpendicular to the transmission direction of the glass plate 7, and is arranged at intervals along the mounting bracket. There is a group of laser thickness gauges 3, and the probes 4 of the laser thickness gauges are arranged vertically downward; a total of twelve laser thickness gauges are used in this embodiment.

[0016] The measuring device also includes a laser thickness measurement control unit 5 and a host computer 6 connected by mutual communication, and each laser thickness measurement instrument is connected with the laser thickness measurement control unit 5 respectively.

[0017] combine figure 2 As shown, when the glass plate 7 is transported by the glass transport roller 1, the laser thickness me...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an on-line nondestructive thickness measuring device for advanced-generation substrate glass, which comprises a mounting bracket arranged above a glass transmission roller, themounting bracket is vertical to the transmission direction of a glass plate, a group of laser thickness measuring instruments are arranged at intervals along the mounting bracket, and probes of the laser thickness measuring instruments are vertically arranged downwards; the measuring device further comprises a laser thickness measuring control unit and an upper computer which are in communicationconnection with each other. Each laser thickness measuring instrument is connected with the laser thickness measuring control unit. When the glass plate is conveyed by the glass conveying roller, thelaser thickness measuring instrument detects the thickness of the glass plate in real time and feeds back a detection result to the upper computer; the device can measure the glass thickness of the glass plate on line before and after surface grinding, does not affect the surface quality of the glass, and improves the detection efficiency.

Description

technical field [0001] The invention relates to the technical field of glass substrate detection equipment, in particular to an online non-destructive thickness measurement device for high-generation substrate glass. Background technique [0002] In order to remove the defects formed on the glass surface during the float glass forming process, the ultra-clean surface substrate glass suitable for TFT panel production is processed. Usually, a polishing machine is used to grind the glass surface. In order to ensure the high consistency of the glass surface after surface grinding, the large-size substrate glass has strict requirements on the amount of grinding. Grinding amount is defined as the thickness value before grinding minus the thickness value after grinding. It is generally required that the grinding amount of the entire glass is controlled within the central value ± 0.5 microns. Accurately measuring the grinding amount of large-size substrate glass is critical to the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
CPCG01B11/0691
Inventor 朱永迁张冲侯建伟朱猛权立振崔国栋
Owner BENGBU CHINA OPTOELECTRONIC TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products