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Semiconductor chip and control method thereof

A semiconductor and chip technology, applied in the field of semiconductor chips and their control, can solve the problems of inaccurate chips, multiple pins, and long time for re-power-on stability, saving pin resources, low power consumption, and reducing power-on stability. The effect of waiting time

Active Publication Date: 2020-12-29
HANGZHOU SDIC MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the batch operation after the chip leaves the factory, it takes too long to re-power on and stabilize
[0004] 2. The chip works with an inaccurate clock and outputs the inaccurate clock from a certain pin of the

Method used

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  • Semiconductor chip and control method thereof
  • Semiconductor chip and control method thereof
  • Semiconductor chip and control method thereof

Examples

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Embodiment Construction

[0029]The principles of the disclosure will now be described with reference to various exemplary embodiments illustrated in the drawings. It should be understood that the descriptions of these embodiments are only for enabling those skilled in the art to better understand and further realize the present disclosure, and are not intended to limit the scope of the present disclosure in any way. It should be noted that similar or identical reference numerals may be used in the figures where feasible, and similar or identical reference numerals may denote similar or identical functions. Those skilled in the art will readily recognize from the following description that alternative embodiments of the structures and methods illustrated herein may be employed without departing from the principles of the disclosed embodiments described herein.

[0030] As mentioned above, in order to realize different functions, existing chips often need to be provided with corresponding pins, which ma...

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PUM

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Abstract

The embodiment of the invention provides a semiconductor chip and a control method thereof. The semiconductor chip includes: a first pin; a second pin; a non-volatile memory; a programming module configured to program the calibration data to the non-volatile memory upon receiving a programming command; and a controller which is coupled to the first pin, the second pin and the programming module, and is configured to enable the semiconductor chip to enter a calibration mode if a command received from an upper computer through the first pin is a preset byte when the semiconductor chip is poweredon, and enable the semiconductor chip to enter a normal working mode if the command is not the preset byte; in the calibration mode, the internal clock frequency is output through the first pin; calibration data is received via the first pin; a program enable command is received via the first pin; and the programming module is caused to carry out programming using the calibration data based on the program enable command. The semiconductor chip described herein may utilize two pins to achieve a variety of functions.

Description

technical field [0001] Embodiments of the present disclosure generally relate to the field of integrated circuits, and more specifically, relate to a semiconductor chip and a control method thereof. Background technique [0002] After the chip leaves the factory, it needs to enter the test mode to calibrate the internal oscillator clock of the chip in batches, and write the calibration content into the non-volatile memory of the chip. Common calibration schemes include the following. [0003] 1. In test mode, the chip uses an external accurate clock to self-calibrate the internal clock, or uses an internal accurate clock to self-calibrate the internal inaccurate clock. Write calibration parameters to registers. The upper computer reads out the calibration parameters of the register, and then writes them into the non-volatile memory of the chip by using another operation method in another operation mode. This calibration scheme requires an accurate clock provided externall...

Claims

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Application Information

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IPC IPC(8): G06F1/08G06F11/22
CPCG06F1/08G06F11/2205G06F11/2273
Inventor 牛晴晴
Owner HANGZHOU SDIC MICROELECTRONICS
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