Portable digital chip automatic test system and working method thereof

Abstract

The invention discloses a portable digital chip automatic test system. The system comprises a power supply module, a test interface module, an FPGA module, a single-chip microcomputer module, a display module, a key module and a switch module. The power supply module is electrically connected with the FPGA module, the single-chip microcomputer module, the display module, the key module and the switch module, and is used for supplying power to the modules, the test interface module is electrically connected with a to-be-tested chip and the FPGA module, the FPGA module is electrically connectedwith the single-chip microcomputer module, the single-chip microcomputer module is further electrically connected with the display module and the key module, the switch module is connected between thepower supply module and the test interface module, and the FPGA module is further used for determining whether the model and the function of the chip to be tested are normal or not according to the stored truth table information of all models of chips when the to-be-tested chip is subjected to chip model identification and function test. The technical problem that the application of the existingdigital chip test instrument is limited due to a small number of supported chip pins can be solved.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and more specifically relates to a portable digital chip automatic testing system and a working method thereof. Background technique [0002] Nowadays, with the rapid development of electronic technology, digital integrated circuits are widely used, such as 74 series logic chips are widely used in digital circuits. However, after many chips have been used many times, the handwriting of the model marked on the chip is blurred and cannot be distinguished; in some cases, even if the model of the chip can be read, its performance cannot be judged in time . [0003] In order to overcome the above problems, researchers have developed various digital chip test instruments, which alleviate the problem of digital chip test automation to a certain extent. However, existing digital chip testing instruments still have some defects that cannot be ignored: first, limited by the system structure, the num...

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Problems solved by technology

[0004] For the above defects or improvement needs of the prior art, the present invention provides a portable digital chip automatic testing system and its working method. The technical problems of its application, as well as the technical problems of a single instrument function due to the inability to realize functional testing and chip model identification at the same time, as well as the technical problems of bulky and inconvenient portability, and the slow speed of existing software-based instrument testing technical problem

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