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Speckle projector calibration parameter determination method for monocular speckle structured light system

A technology of structured light system and parameter calibration, applied in the testing of machine/structural components, optical instrument testing, instruments, etc., can solve the problems of depth error, unacceptable, etc.

Active Publication Date: 2020-08-04
合肥的卢深视科技有限公司
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Problems solved by technology

[0026] The embodiment of the present invention provides a method for determining the calibration parameters of the speckle projector of the monocular speckle structured light system, which is used to solve the depth error caused by the inability to accurately calibrate in the existing monocular speckle structured light system. The problem that the precision occasion cannot be accepted

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  • Speckle projector calibration parameter determination method for monocular speckle structured light system

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Embodiment Construction

[0079] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0080] The existing monocular speckle structured light system generally has the problem that the depth error caused by the inability to accurately calibrate can not be accepted in high-precision occasions. In this regard, an embodiment of the present invention provides a method for determining calibration parameters of a speckle projector of ...

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Abstract

The embodiment of the invention provides a speckle projector calibration parameter determination method for a monocular speckle structured light system. The method comprises the following steps: determining internal parameters of a camera; determining q mark points in a reference plane, and collecting images of the reference plane when the speckle projector is turned on and turned off when the camera is located at two different positions respectively; determining a plane equation of the reference plane in the images acquired by the camera at the two different positions based on three-dimensional coordinates of mark points in the images acquired by the camera at the two different positions in a camera coordinate system when the speckle projector is turned off; determining three-dimensionalcoordinates of speckle points and homonymy points in the camera coordinate system based on the plane equation and pixel coordinates of s speckle points and s homonymy points selected in the image whenthe speckle projector is started; and determining horizontal axis coordinates and vertical axis coordinates of the speckle projector based on the three-dimensional coordinates of the speckle spots and the homonymous points. According to the method provided by the embodiment of the invention, accurate calibration of the position parameters of the speckle projector is realized.

Description

technical field [0001] The invention relates to the technical field of monocular speckle structured light systems, in particular to a method for determining calibration parameters of a speckle projector of a monocular speckle structured light system. Background technique [0002] In 3D measurement technology, monocular speckle-based structured light technology is an important branch, which is favored by its advantages of high precision and low price, and has been widely used in consumer electronics, games, industry and other fields. For example, Microsoft's Kinect generation products, Iphonex's FaceID technology, etc., are all based on monocular speckle mechanism light solutions. Generally, an active infrared speckle generator is used to endow the surface of the scene with rich image feature information, and then the camera is used to record the speckle image of the scene, and the depth information of the scene is calculated to finally obtain the depth image or 3D data. Bef...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0264
Inventor 户磊薛远李东洋化雪诚王亚运
Owner 合肥的卢深视科技有限公司
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