Speckle projector calibration parameter determination method for monocular speckle structured light system
A technology of structured light system and parameter calibration, applied in the testing of machine/structural components, optical instrument testing, instruments, etc., can solve the problems of depth error, unacceptable, etc.
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[0079] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0080] The existing monocular speckle structured light system generally has the problem that the depth error caused by the inability to accurately calibrate can not be accepted in high-precision occasions. In this regard, an embodiment of the present invention provides a method for determining calibration parameters of a speckle projector of ...
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