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A method for improving the mass accuracy of a single particle aerosol mass spectrometer

An aerosol and mass spectrometer technology, which is applied in particle size analysis, particle and sedimentation analysis, instruments, etc., can solve problems such as calibration deviation, achieve fine mass resolution, improve mass accuracy, and enhance the effect of international status

Active Publication Date: 2022-05-17
JINAN UNIVERSITY
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Problems solved by technology

[0006] Aiming at the problem of deviation in calibration existing in the prior art, the present invention provides a method for improving the mass accuracy of a single particle aerosol mass spectrometer

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  • A method for improving the mass accuracy of a single particle aerosol mass spectrometer
  • A method for improving the mass accuracy of a single particle aerosol mass spectrometer
  • A method for improving the mass accuracy of a single particle aerosol mass spectrometer

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Embodiment Construction

[0026] The present invention will be further described below in conjunction with drawings and embodiments.

[0027] see figure 1 , a method for improving the mass accuracy of a single particle aerosol mass spectrometer, comprising:

[0028] S1, perform primary correction on the time-of-flight spectrum of known particles by the statistical median method; specifically, step S1 includes: obtaining the time-of-flight spectra of K particles of the same type of known particles, and obtaining n from the time-of-flight spectra characteristic peaks time-of-flight distribution According to the time-of-flight distribution of the characteristic spectral peak Get the median of the flight time in turn Correction equation to data and Fitting is performed to obtain the basic correction equation. Standard samples or particles with characteristic spectra (known particles) are used to perform experiments on known particles using a single particle mass spectrometer to obtain time-o...

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Abstract

The invention relates to a method for improving the mass accuracy of a single particle aerosol mass spectrometer, comprising: S1, performing primary correction on the time-of-flight spectrum of known particles by means of a statistical median; S2, correcting the time-of-flight spectrum of known particles according to the primary method As a result, the type of the sampled particle and the precise mass-to-charge ratio of the corresponding characteristic peak are determined; S3, accurate correction of the time-of-flight spectrum of a single sampled particle is realized according to the precise mass-to-charge ratio. In the present invention, the primary correction is performed by the time-of-flight spectrum of the known particles by a statistical method, and the type of the sampled particles and the precise mass-to-charge ratio of the corresponding characteristic peak are determined according to the result of the primary time-of-flight spectrum correction; The precise correction of the time-of-flight spectrum of a single sampled particle can improve the mass accuracy, achieve more refined mass resolution, and improve the accuracy of particle component identification.

Description

technical field [0001] The invention relates to the technical field of aerosol mass spectrometers, in particular to a method for improving the mass accuracy of a single particle aerosol mass spectrometer. Background technique [0002] Single Particle Aerosol Mass Spectrometry (SPAMS) is a mass spectrometer for the simultaneous detection and analysis of aerosol particle size (Particle Size) and composition (Chemical Composition), which is widely used in environmental monitoring, gas Sol characteristics research, aerosol pollution source analysis and other fields. When SPAMS conducts component analysis, it first ionizes the aerosol particles into charged ions with different mass-to-charge ratios, and the ions with different mass-to-charge ratios move under the electric field of the time-of-flight mass analyzer. Since different types of ions have different mass-to-charge ratios, The flight time of ions reaching the ion detector is different. By establishing the mapping relatio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/00G01N15/02G01N27/62G06F17/18
CPCG01N15/00G01N15/02G01N27/62G06F17/18
Inventor 李磊杜绪兵黄正旭高伟李梅周振
Owner JINAN UNIVERSITY
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