High-precision measurement method of tooth pitch deviation and tooth profile deviation of tiny gears based on white light interferometer
A technology of white light interferometer and measurement method, which is applied in the direction of measuring devices, instruments, and optical devices, etc. It can solve the problem that the size of micro gears is small, visual measurement cannot meet the precision requirements of micro gears, and the spot diameter of laser displacement sensor cannot meet the measurement of micro gears. Requirements and other issues to achieve the effect of improving centering accuracy and ensuring extraction accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0040] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. However, it should not be understood that the scope of the above subject matter of the present invention is limited to the following implementation manners, and all technologies realized based on the contents of the present invention belong to the scope of the present invention.
[0041]The measurement equipment used in the present invention is Taylor Hobson's CCI MP series white light interferometer, the measurement software is TalysurfCCI, and the analysis software is TalyMap Gold V7. The resolution of the white light interferometer in the Z-axis direction can reach 0.01nm, and it is a high-precision measurement device widely used in three-dimensional surface topography measurement. The parameters of the tested tiny gears are: number of teeth 7, modulus 0.08, pressure angle 20°, coefficient of variation +0.3.
[0042] The high-precis...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com