Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Memory positioning device

A technology of positioning device and memory, which is applied in the directions of measuring devices, instruments, measuring instrument components, etc., can solve the problems of increased design cost and low generality of debugging tools, and achieves reduced design cost, good versatility, and good positioning effect. Effect

Pending Publication Date: 2020-03-24
CHANGXIN MEMORY TECH INC
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If you want to test a variety of memories, you need to purchase the corresponding memories for measurement, resulting in a substantial increase in design costs, and the versatility of debugging tools is not high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory positioning device
  • Memory positioning device
  • Memory positioning device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0050] refer to figure 1, which representatively shows a top view of the memory positioning device proposed in the present disclosure. In this exemplary implementation, the memory positioning device proposed in the present disclosure is described as an application to positioning memory as an example. It is easy for those skilled in the art to understand that in order to apply the relevant design of the present disclosure to other types of electronic chips or other processes, various modifications, additions, substitutions, deletions or other modifications are made to the following specific embodiments variations that remain within the scope of the principles of the memory location device proposed by this disclosure.

[0051] Such as figure 1 As shown, in this embodiment, the memory positioning device proposed in the present disclosure is mainly used for aligning the memory to be tested. The memory positioning device includes a positioning mechanism for positioning the memor...

Embodiment approach 2

[0065] refer to Figure 5 , which representatively shows a bottom view of another embodiment of the memory positioning device proposed in the present disclosure. In this exemplary embodiment, the design of the memory positioning device proposed in the present disclosure is substantially the same as that in the above-mentioned embodiment, and the main differences thereof will be described in detail below with reference to the accompanying drawings.

[0066] Such as Figure 5 As shown, in this embodiment, each positioner mainly includes a second pressing block and an elastic member. Specifically, the second pressing block is slidably arranged on the base plate. One end of the elastic member is connected to the second pressing block, and the other end of the elastic member is connected to the substrate. The elastic member is used to provide an elastic restoring force to the pressing block, so that when the pressing block slides away from the groove on the substrate, it needs to...

Embodiment approach 3

[0072] Another exemplary implementation of the memory location device proposed by the present disclosure is described below. In this exemplary embodiment, the design of the memory positioning device proposed in the present disclosure is substantially the same as that in the above embodiment, and the main differences will be described in detail below.

[0073] In this embodiment, each positioner mainly includes a positioning rod and a temperature control mechanism. Specifically, one end of the positioning rod is connected to the base plate, and the other end of the positioning rod extends toward the slotting direction. Wherein, the material of the positioning rod is a shape memory alloy and has a phase transition temperature value. When the temperature of the positioning rod is lower than the phase transition temperature value, it is in a shrinking state. When the temperature of the positioning rod is greater than or equal to the phase transition temperature value, the is unfo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a memory positioning device. The memory positioning device comprises a positioning mechanism, the positioning mechanism is configured to position the memory, and the positioningmechanism comprises a substrate and at least one group of positioning assemblies. The substrate is provided with at least one positioning groove penetrating through the substrate, the positioning grooves are configured to contain the memories, and the shapes of the positioning grooves are matched with the shapes of the memories. The at least one set of positioning assemblies are arranged corresponding to the at least one positioning groove, and each set of positioning assemblies comprises a plurality of positioners arranged on the substrate. The plurality of positioners are distributed aroundthe positioning groove at intervals, and the positioners are configured to adjustably position the memories. The memory positioning device can meet the positioning requirements of memories of different sizes, does not need to measure the to-be-debugged memory in advance, greatly reduces the design cost, and is better in universality.

Description

technical field [0001] The present disclosure relates to the technical field of universal debugging tools for memory, in particular to a memory positioning device. Background technique [0002] As an important electronic component, the memory usually needs to be located with a debugging tool during its debugging. Before the existing memory debugging tools are designed and used, the specific size of the memory must be known before the debugging tools can be designed. Therefore, for producers and manufacturers of debugging tools, it is necessary to purchase corresponding memories in advance for measurement, so as to further design and manufacture the memory debugging tools. If it is necessary to test a variety of memories, it is necessary to purchase corresponding memories for measurement, resulting in a substantial increase in design costs, and the universality of debugging tools is not high. Contents of the invention [0003] A main purpose of the present disclosure is t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01D11/00
CPCG01D11/00
Inventor 陈宏宗
Owner CHANGXIN MEMORY TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products