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Mock test method and device and storage medium

A testing method and technology for testing tasks, applied in software testing/debugging, error detection/correction, structured data retrieval, etc. The effect of easy data maintenance and memory saving

Pending Publication Date: 2020-01-21
BEIKE TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the existing Mock data configuration method, since all Mock data is written in the code file or configuration file, when the amount of data is large, it will lead to an excessive amount of code and increase the compilation time. After the test is started, all Mock The data will be loaded and stored in the memory of the test server, which wastes the memory of the test server to a certain extent. Moreover, when the mock data changes, it is necessary to change the code and redeploy the service, which is inconvenient for maintenance and increases the workload of technicians.

Method used

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Embodiment Construction

[0043] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some, not all, embodiments of the application. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0044] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the present invention and the above drawings are used to distinguish similar objects, and not necessarily Used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of practice in sequences other than those illustrated or des...

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Abstract

The invention discloses a Mock test method and device and a storage medium. The method specifically comprises the following steps: a test server receives a test task of a Mock test; according to the type of the test task, request information for obtaining Mock data is sent to a Mock database, the Mock data is data used for Mock testing, the request information comprises query conditions of the Mock data, and the Mock database is used for managing the Mock data needed in the Mock testing; the Mock database receives the request information, searches Mock data corresponding to the acquired test task according to the query condition, and returns the acquired Mock data to the test server; and after receiving the Mock data, the test server executes the test task, so that maintenance of the Mockdata in the Mock test can be facilitated based on the scheme, and the workload of technicians is reduced.

Description

technical field [0001] The present application relates to the technical field of automated testing, in particular to a mock testing method, device and storage medium. Background technique [0002] Mock test refers to a test method that uses a virtual object to create a test method for some objects that are not easy to construct or obtain during the test process. Mock data is used in the Mock test service for related tests. In the prior art, the Mock data is usually pre-configured in the code, and stored in the memory of the test server when the code is compiled. When the automated test is executed, the Mock in the memory is read. data. In addition, the Mock data can also be written in the configuration file. Before the automated test is executed, the test server loads the configuration file and parses out the Mock data in the configuration file, which is stored in the memory of the test server. When the automated test is executed, read Mock data in memory. [0003] Howeve...

Claims

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Application Information

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IPC IPC(8): G06F16/21G06F16/23G06F11/36
CPCG06F16/23G06F16/2358G06F16/217G06F16/2365G06F11/3672
Inventor 吕晨
Owner BEIKE TECH CO LTD
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