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Low-frequency vibration isolation test bench and vibration detecting system

A test bench and vibration isolation technology, used in vibration testing, machine/structural component testing, measuring devices, etc., can solve the problems of harsh use conditions and high prices, and achieve the effect of strong applicability, taking into account functions and costs

Inactive Publication Date: 2019-10-25
NORTHWESTERN POLYTECHNICAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to avoid the deficiencies of the existing technology, the present invention proposes a low-frequency vibration isolation test bench and a vibration detection system for many vibration isolation devices in the field of mechanical vibration isolation, so as to avoid the problems of high price and harsh service conditions.

Method used

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  • Low-frequency vibration isolation test bench and vibration detecting system

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Embodiment Construction

[0020] Now in conjunction with embodiment, accompanying drawing, the present invention will be further described:

[0021] Low frequency vibration isolation test benches such as figure 2 As shown, the vibration source table includes a vibration source table base 1, a guide rod support seat 2, a guide rod 3, a motor installation base 4, a motor support 5, a vibration source motor 6, a swing arm 7, a connecting rod 8, Vibration table 9, linear bearing slider 10, vibration isolator installation base plate 11, vibration isolator 12 and connecting rod hinged seat 13. The function of the vibration source table is to provide a vibration source with adjustable amplitude and frequency as the input vibration of the vibration isolator under test.

[0022] Such as image 3 As shown, a guide rod support seat 2 is installed on the base 1 of the vibration source table, and the guide rod 3 is vertically fixed in the guide rod support seat 2 . A motor installation base 4 is installed on th...

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Abstract

The invention relates to a low-frequency vibration isolation test bench and a vibration detecting system. A vibration isolator is fixed on a vibration table, the input vibration is obtained from the vibration table, the vibration is isolated or weakened by an internal structure, and then the final vibration is outputted from a platform at a top of the vibration isolator. A high-speed camera and atungsten illuminator are placed on the front and rear sides of the vibration table. Light from the tungsten illuminator enters the high-speed camera, a portion blocked by the vibration isolator formsa shadow, and so that the vibration isolator can be seen in the high-speed camera. The invention is suitable for detecting low-frequency vibration of a millimeter scale and above, and the vibration isolation effect of the vibration isolator operating in the range can be quickly and easily detected. The invention has the advantages that: (1) a vibration source platform with adjustable amplitude andfrequency is provided, the vibration source platform is simple and practical, and functions and costs are considered, and (2) the vibration information is obtained by using a method of computer imageprocessing, the applicability is high, the invention has no special requirement for a working environment, and the non-contact measurement of vibration is achieved without introducing a human error.

Description

technical field [0001] The invention belongs to the field of vibration experiment and detection, and relates to a low-frequency vibration isolation test bench and a vibration detection system. Background technique [0002] Vibration is a relatively common phenomenon in mechanical engineering. In many scenarios, vibration is harmful. For example, the vibration of a car will cause discomfort to the driver or passengers, and the vibration of rockets and aircraft will cause loosening or even damage to the structure. The vibration caused by the power system in the ship and submarine system will make the carrier itself present obvious noise characteristics, increasing the risk of exposure. In the field of ultra-precision processing and measurement, such as ultra-precision semiconductor manufacturing, scanning tunneling microscope and atomic force microscope measurement, vibration has gradually become an important factor hindering the improvement of its accuracy. Therefore, how to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M7/02
CPCG01M7/022G01M7/025
Inventor 王冠华潘光施瑶黄桥高姜军杜晓旭
Owner NORTHWESTERN POLYTECHNICAL UNIV
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