TE Process Fault Diagnosis Method Based on Parameter Optimization Deep Belief Network Model
A deep belief network and fault diagnosis technology, which is applied in the direction of instruments, test/monitoring control systems, control/regulation systems, etc., can solve the problems of reducing network generalization ability, large network scale, and difficulty in convergence, so as to avoid easy to fall into local The effect of minimum value, fast convergence speed, and strong global convergence ability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0073] The specific embodiments and working principles of the present invention will be further described in detail below with reference to the accompanying drawings.
[0074] from figure 1 It can be seen that a TE process fault diagnosis method based on a parameter-optimized deep belief network model is performed according to the following steps:
[0075] Step 1: Carry out experimental simulation with the TE process as the research object, obtain simulation data, and divide the simulation data into training set data samples and test set data samples;
[0076] The specific content of the test simulation in step 1 is:
[0077] From all the observed variables of the TE process, randomly select a gc observed variables as output variables, A-a gc An observed variable is used as a control variable;
[0078] In this embodiment, software environment: Matlab2016a, Windows7 operating system; hardware environment: CPU 2.20GHz, memory 8GB, 750G hard disk.
[0079] In this embodiment...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com