EEPROM data protection method for intelligent electric energy meter

Abstract

The invention discloses an EEPROM data protection method for an intelligent electric energy meter. The system comprises a parameter protection module for the intelligent electric energy meter and an electric quantity protection module for the for the intelligent electric energy meter. The parameter protection module is provided with double parameter backup areas of different areas of an EEPROM anda FLASH parameter solidification area of an MCU. The electric quantity protection module is provided with two electric quantity storage areas in an RAM of an MCU and electric quantity double backup areas of different areas of an EEPROM. The EEPROM data protection method comprises the following steps: step (1), operating application paramaters inside a function module through parameter protectionmodule for the intelligent electric energy meter and timely examining paramaters through a system; and step (2), performing electric quantity storage operation and electric quantity reading operationthrough the electric quantity protection module for the intelligent electric energy meter. The parameter reliability and the electric quantity data reliability of the electric energy meter are ensured.

Description

technical field [0001] The invention relates to the field of smart electric energy meters, in particular to an EEPROM data protection method of the intelligent electric energy meter. Background technique [0002] The State Grid began to implement the smart energy meter program in 2009, and promulgated the "09 Edition Smart Energy Meter Specifications" and "13 Edition Smart Energy Meter Specifications" in 2009 and 2013 respectively. At present, the smart energy meters have been connected to the grid and operated for hundreds of millions Only. With the long-term operation of smart meters, for example, the smart meters have been connected to the network for 8 years in 2009, and the related reliability problems have gradually been exposed. The cases of user electricity bill disputes due to smart meter failures have also gradually increased, affecting public opinion. One of the typical failure cases is the failure of the EEPROM (Electrically Erasable Programmable Read-Only Memor...

AI Technical Summary

Problems solved by technology

[0005] The reduction in the life of EEPROM is mainly caused by three reasons. One is that the components themselves are not shipped well; the other is that the circuit parameters are not well matched and the electrical performance is not optimized; the third is that the software is frequently erased and written

[0006] 2. The software does not design parameters and power data protection mechanism;

However, this method can only be used to protect the data when the power is off, and cannot protect the data when the EEPROM fails.

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