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Dust detection cleaning device

A cleaning device, dust detection technology, applied in measurement devices, optical testing flaws/defects, instruments, etc., can solve problems such as failure to completely solve, cleaning equipment pollution, affecting yield, etc., to change the waste of water resources and change the environment. Pollution, the effect of reducing production costs

Pending Publication Date: 2019-07-09
深圳创视品川光学科技有限公司
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  • Application Information

AI Technical Summary

Problems solved by technology

Domestic silicon wafer cleaning mostly adopts the cleaning process mainly based on wet chemical cleaning. Due to the relatively backward equipment and process methods, especially the ultra-clean environment often cannot reach the corresponding level, so it cannot reach the out-of-the-box standard
[0004] Although the off-line silicon wafer cleaning technology has been greatly developed at present, the pollution problem caused by the cleaning equipment itself has not been completely solved, which has become an important factor affecting the yield

Method used

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Embodiment Construction

[0035] In order to enable those skilled in the art to better understand the technical solution of the present invention, the product of the present invention will be further described in detail below in conjunction with the embodiments and accompanying drawings.

[0036] Such as figure 1 As shown, a dust detection and cleaning device is characterized in that: the device is provided with a machine platform 5, and the detection device 1 and the cleaning device 3 are arranged side by side on the said machine platform 5, and the detection device 1 and the cleaning device 3 are provided with There is a component transfer device 2;

[0037] The detection device 1 includes a component transfer mechanism 11, a component moving mechanism 12, a position detection module 13, a dust detection mechanism 14 and a component carrying mechanism 15, the component transfer mechanism 11 and the component carrying mechanism 15 are arranged in parallel, and the dust detection mechanism 14 is arran...

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Abstract

The invention discloses a dust detection cleaning device. The device is provided with a machine, a detection device and a cleaning device are arranged on the machine in parallel; and a module transmission device is arranged between the detection device and the cleaning device; the detection device comprises a module transferring mechanism, a module moving mechanism, a location detection module, adust detection mechanism and a module bearing mechanism; the module transferring mechanism and the module bearing mechanism are arranged in parallel; the dust detection mechanism is arranged at one side of the module bearing mechanism; the module moving mechanism is vertically arranged above the module transferring module and the module bearing mechanism; the location detection module is arrangedon the module moving mechanism; the cleaning device comprises a dust removing device, the dust removing device and the module moving mechanism are arranged in parallel; the detection device, the cleaning device and the module transmission device are controlled through a central control device. The cleaning device disclosed by the invention has the advantages of being full-automatic in online dry cleaning and targeted fixed-point cleaning, low in water consumption, low in pollution and low in production cost.

Description

technical field [0001] The invention relates to a cleaning device, in particular to a dust detection and cleaning device. Background technique [0002] With the development of high-tech products, the cleanliness of components in the production process of high-precision products is getting higher and higher, such as the assembly of optical filters and photosensitive chips of camera modules, and the preparation of semiconductor products. There is no cleaning inspection and cleaning of the relevant parts, and the direct use of the preparation causes the fine particles and dust attached to the surface of the parts to directly affect the quality and use effect of the product. However, with the development of technology, the requirements for process technology are getting higher and higher. For example, the requirements for the surface quality of semiconductor chips and optical components are becoming more and more stringent. The main reason is that the dust particles and impuriti...

Claims

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Application Information

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IPC IPC(8): G01D21/02G01N21/94H01L21/67
CPCG01D21/02G01N21/94H01L21/67011
Inventor 周寿红
Owner 深圳创视品川光学科技有限公司
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