A Grating Data Acquisition System for Displacement or Angle Measurement

Abstract

The invention relates to a displacement or angle measurement system, in particular to a grating data acquisition system for displacement or angle measurement. The grating data acquisition system comprises a CPU, an FPGA and a channel switching unit, has two modes of acquisition and self-testing, and performs switching between the two modes by means of the channel switching unit. In the acquisitionmode, a displacement or angular signal to be acquired is input to a grating data acquisition controller in the FPGA for analysis by means of the channel switching unit. In the self-testing mode, a grating signal generation controller in the FPGA generates a test grating signal according to a CPU instruction, and inputs the test grating signal to the grating data acquisition controller in the FPGAfor analysis by means of the channel switching unit, and the CPU determines whether the system operates normally based on the analysis result and the instruction content. The grating data acquisitionsystem for displacement or angle measurement having a small number of components, high reliability and a self-detection function is provided by the invention.

Description

technical field [0001] The invention relates to a displacement and angle measurement system, in particular to a grating data acquisition system for displacement or angle measurement. Background technique [0002] Accurate measurement of parameters such as displacement and angle is of great significance to ensure the safety of aircraft. In the field of aviation, grating encoders are commonly used displacement and angle sensors. However, the complex airborne electromagnetic environment often affects the system, and when the grating data is transmitted through the cable as a voltage signal, it is very easy to be interfered by high-frequency signals, resulting in incorrect acquisition results. Therefore, the airborne displacement and angle measurement system needs to meet the requirements of high test coverage and strong anti-interference ability. [0003] At present, the commonly used method to improve system test coverage is to design special test equipment, generate incentiv...

AI Technical Summary

Problems solved by technology

[0003] At present, the commonly used method to improve system test coverage is to design special test equipment, generate incentives through the test equipment, and test whether the system works normally. However, making special test equipment is often expensive and can only be tested offline on the ground; commonly used The way to enhance the anti-interference ability of the system is to increase the analog filter circuit. However, increasing the analog filter circuit requires a certain number of analog components, which reduces the reliability of the system. At the same time, analog devices are susceptible to environmental factors such as temperature and parameters drift

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