A device for extracting key parameters of optoelectronic electro-optical devices

A technology of electro-optical devices and extraction devices, which is applied in the field of microwave technology and optoelectronics, can solve the problems of being unable to test other key parameters, and achieve the effect of convenient testing experience

Active Publication Date: 2020-11-10
THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem that the existing optical network parameter comprehensive tester can only test the frequency response characteristics of optoelectronic / electro-optic devices, but cannot test other key parameters, the present invention proposes a photoelectric / electro-optic Device key parameter extraction device

Method used

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  • A device for extracting key parameters of optoelectronic electro-optical devices
  • A device for extracting key parameters of optoelectronic electro-optical devices
  • A device for extracting key parameters of optoelectronic electro-optical devices

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Embodiment 1

[0029] After the device proposed by the present invention is connected with the optical network parameter comprehensive tester; with the help of related devices integrated inside the device, the measurement of key parameters of the photoelectric device and electro-optical device can be automatically completed, and the measurement data can be uploaded through the physical interface to the optical network parameter comprehensive tester, and finally display it to the user in the form of a graphical interface on the display screen of the optical network parameter comprehensive tester; and the user proposed by the present invention can automatically complete the performance test of the device in different bands, which is more convenient for the user Fully grasp the performance of the device under test.

[0030] During testing, the optoelectronic device needs a reverse bias voltage of +5V~+12V, and the electro-optic device needs automatic bias control to ensure its stable operation; ...

Embodiment 2

[0032] On the basis of Embodiment 1, in this embodiment, the electro-optic device adopts an electro-optic modulator, and the optoelectronic device adopts a photodetector, and this embodiment further describes the present invention in conjunction with specific parameters; the present invention discloses a Key parameter extraction device for optoelectronic / electro-optical devices used in conjunction with the parameter comprehensive tester, such as figure 1 As shown; the device has 3 optical interfaces, 2 electrical interfaces and 1 USB interface; specifically corresponding to the first optical input interface, the first optical output interface and the second optical output interface; the first electrical interface, the second electrical interface interface and physical interface;

[0033] Wherein, the first optical input interface is connected to the optical output port of the optical network parameter comprehensive tester, the first optical input interface is connected to the ...

Embodiment 3

[0049] On the basis of the previous embodiments, when the first laser of this embodiment adopts a 1550nm laser and the second laser adopts a 1310nm laser, when testing the photodetector, the control and data processing circuit board first controls the second optical switch to connect Through the first optical input interface, the light from the optical output port of the optical network parameter comprehensive tester is introduced into the photodetector to be tested through the second splitter, and the radio frequency output interface of the photodetector to be tested is connected to the optical network parameter comprehensive tester. The RF input port connection. The second electrical interface of the parameter extraction device is connected to the power supply pin of the photodetector to be tested to provide it with a reverse bias voltage of +5V~+12V, so that the optical network parameter comprehensive tester can directly measure the frequency of the photodetector to be teste...

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Abstract

The invention belongs to the technical field of microwave technologies and photoelectrons, and especially relates to a key parameter extraction device for a photoelectric electro-optical device for anoptical network parameter comprehensive tester. The extraction device is used for being connected with an optical network parameter comprehensive tester through a physical interface, so as to extractkey parameters of a photoelectric / electro-optical device to be tested, and display the key parameters in the optical network parameter comprehensive tester by an image interface; and the device comprises a control and data processing circuit board, a first laser, a second laser, a first optical switch, a first optical splitter, a tunable optical attenuator, a second optical splitter, a second optical splitter and a standard detector. By adopting the parameter extraction device proposed by the invention, a user can conveniently complete the test work quickly, and extract more comprehensive keyparameters of the photoelectric / electro-optical device to be tested.

Description

technical field [0001] The invention relates to the fields of microwave technology and optoelectronic technology, in particular to a device for extracting key parameters of an optoelectronic / electro-optical device used in an optical network parameter comprehensive tester. Background technique [0002] Optical network parameter comprehensive tester is a vector network analyzer with calibrated standard optical transmitting unit and optical receiving unit. The frequency characteristics of amplitude and phase of each scattering parameter are given. [0003] The optoelectronic / electro-optic devices that can be tested by an optical network parameter comprehensive tester mainly include photodetectors and electro-optic modulators; producers and users of these typical optoelectronic / electro-optic devices usually need to master the amplitude and Phase response characteristics to evaluate the quality of the device, the optical network parameter comprehensive tester can complete the te...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B10/079H04B10/50H04Q11/00
CPCH04B10/079H04B10/503H04Q11/0062H04Q2011/0083
Inventor 张羽孙力军梁旭徐静朱煜西廖理
Owner THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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