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Speaker life test system

A technology of life testing and loudspeaker, which is applied in the direction of electrical components, etc., can solve the problems of analysis, low efficiency, and long protection algorithm verification cycle time, and achieve the effect of large number of samples, shortened judgment cycle, and rich data volume

Active Publication Date: 2021-01-26
WUHAN JUXIN MICROELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing tests on speaker life cannot analyze the test process, and cannot determine when and under what conditions the speaker is damaged, but can only determine whether the speaker is damaged and the critical time of damage. This feedback makes the protection algorithm Long verification cycle time and low efficiency

Method used

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Embodiment Construction

[0016] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0017] Such as figure 1 As shown, an embodiment of the present invention provides a loudspeaker life test system, comprising: a life test board 1, a plurality of displacement sensors 2 and a host computer 3; , a multi-channel differential voltage signal measurement module 13 , a plurality of power amplifier chips 14 and a plurality of temperature...

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Abstract

The embodiment of the invention provides a loudspeaker service life test system, and the system can effectively monitor the real-time working states of loudspeakers in batches through an upper computer and store the test data of the whole test states. The system is large in sample number, long in test time and rich in data. The upper computer can analyze the service life test process of a loudspeaker according to the information sent by a single chip microcomputer and the amplitude of the vibrating diaphragm in the loudspeaker connected with each current measuring resistor so as to judge whether the loudspeaker is damaged or not, feedback can be obtained without waiting for the test of a loudspeaker manufacturer, and the judgment period is shortened. The system also can determine the timeand condition of the damage of the loudspeaker connected with each test resistor, and facilitates the providing of the reasonable feedback suggestions for a certain protection measure of the loudspeaker.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of loudspeaker life testing, and more specifically, to a loudspeaker life testing system. Background technique [0002] At present, the loudspeaker life test system is used to verify whether the loudspeaker will still be damaged under the protection of a certain protection algorithm (amplitude protection algorithm, temperature protection algorithm or power protection algorithm) under the condition of connecting a smart power amplifier for continuous long-term work. Wherein, the damage may specifically include mechanical damage caused by loudspeaker amplitude frequently exceeding the physical limit, and thermal damage caused by long-term overheating work. [0003] The existing testing process for the life of a loudspeaker is to apply an excitation signal for a set time to the loudspeaker through an intelligent power amplifier. After applying the excitation signal for a set time, the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04R29/00
CPCH04R29/001
Inventor 明幼林段志杰王寅
Owner WUHAN JUXIN MICROELECTRONICS CO LTD
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