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Optical imaging system, method, device and storage medium

An optical imaging system and optical imaging technology, applied in optics, measuring devices, optical components, etc., can solve the problems of low resolution of optical microscopes, expensive probes, low characterization rate of atomic force microscopes, etc., to improve characterization efficiency, preparation Low cost, flexible effect

Active Publication Date: 2020-09-29
SUN YAT SEN UNIV
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  • Description
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Problems solved by technology

[0004] Based on this, it is necessary to provide an optical imaging system, method, device and storage medium for the technical problems of low resolution of optical microscopy, low characterization rate of atomic force microscopy and expensive probes of traditional technology.

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  • Optical imaging system, method, device and storage medium
  • Optical imaging system, method, device and storage medium
  • Optical imaging system, method, device and storage medium

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Embodiment Construction

[0043] In order to facilitate the understanding of the present invention, the following will describe the present invention more fully. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0044] It should be noted that when an element is referred to as being “disposed on” or “placed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

[0045] It should be noted that the term "first\second\third" involved in the embodiment is only to distinguish similar objects, and does not represent a specific ordering of objects. Understandably, "first\second...

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Abstract

The invention relates to a system, a method, and a device for optical imaging, and a storage medium. The system for optical imaging comprises: a polymer elastic probe array, an optical lens, a camera,and a processing apparatus. The method for optical imaging comprises the following steps: a controlling apparatus controls the polymer elastic probe array to scan the surface of a to-be-tested sampleat a constant height; the optical lens receives optical intensity signals reflected by the compression deformation of the polymer elastic probe array when scanning the surface of the to-be-tested sample, and presents an object image corresponding to the optical intensity signals; the camera collects the optical intensity images corresponding to the object images to the controlling apparatus; andthe controlling apparatus processes the optical intensity images to obtain the surface topography images of the to-be-tested sample. The system, the method, and the device for optical imaging, and thestorage medium solve the technical problems that the conventional optical imaging mirror has low resolution and the atomic force microscopy scanning has low characterization efficiency, and improve the resolution and characterization efficiency of the surface topography images of the to-be-tested sample. The polymer elastic probe array has advantages that preparation costs are low, no damage to the surface of the sample, and the array can be prepared in a large area and can be used repeatedly.

Description

technical field [0001] The invention relates to the field of optical imaging, in particular to an optical imaging system, method, device and storage medium. Background technique [0002] In recent years, the rapid development of nanotechnology has increased the requirements for high-resolution microscopic imaging technology, especially in the field of electronic image applications, which put forward higher requirements for high-resolution images of nanometer size. Traditional optical microscopes are composed of optical lenses, which use changes in the refractive index and curvature of the lenses to magnify the observed object to obtain its detailed information. However, in optical microscopy technology, optical imaging has a diffraction-limited phenomenon, and the diffraction limit of light limits the further improvement of the resolution of optical microscopes, making it difficult for the resolution to break through 200 nanometers. [0003] Traditional technology uses atom...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/84G01N21/01G02B21/00
CPCG01N21/01G01N21/84G01N2021/0112G02B21/002
Inventor 吴进黄文轩吴子轩
Owner SUN YAT SEN UNIV
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