A silicon carbide MOSFET device and a manufacturing method thereof
A silicon carbide and device technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as high production cost, high power loss, and low work efficiency
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Embodiment 1
[0071] Such as figure 2 As shown, a silicon carbide MOSFET device, the cell structure includes drain metal 1, silicon carbide N + Substrate 2 and SiC N - epitaxial layer 3; the silicon carbide N - There is a silicon carbide P+ region 4 on the upper left of the epitaxial layer 3, and the silicon carbide N - The upper right of the epitaxial layer 3 has a mesa structure, the mesa structure includes a silicon carbide Pbase region 10, a silicon carbide N+ source region 11 and a silicon carbide P+ contact region 12, and the silicon carbide N+ source region 11 and silicon carbide P+ contact region 12 are located Above the silicon carbide Pbase region 10, on the left side of the mesa structure, silicon carbide N - There is a gate structure above the epitaxial layer 3, and the gate structure includes a gate dielectric layer 5, a polysilicon gate 6, and a gate electrode 9. The polysilicon gate 6 is surrounded by the gate dielectric layer 5, and its upper part is drawn out through th...
Embodiment 2
[0073] The structure of this embodiment is substantially the same as that of Embodiment 1, except that the Schottky contact metal 13 has a larger lateral dimension, and the right side of the Schottky contact metal 13 covers the bottom region of the gate structure. Such as image 3 shown. This setting increases the Schottky contact area while reducing the cell area, so that the device has better on-state characteristics.
Embodiment 3
[0075] The structure of this embodiment is substantially the same as that of Embodiment 1, except that the bottom region of the gate structure has a silicon carbide P+ region 4, such as Figure 4 shown. This improvement is beneficial to the further protection of the gate structure and the Schottky contact metal 13, so as to improve the long-term reliability of the device;
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