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Device and method for dynamic wavelength measurement of diode laser under wavelength modulation

A diode laser and wavelength measurement technology, which is applied in measuring devices, optical radiation measurement, optical instrument testing, etc., can solve the problems of high dynamic wavelength and high response rate of diode lasers, and achieve the effect of low price and easy operation

Active Publication Date: 2020-05-05
NORTHWEST INST OF NUCLEAR TECH
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0011] In order to solve the problem of measuring the dynamic wavelength of a diode laser with high precision and high response rate under the condition of wavelength modulation, the present invention provides a device and method for measuring the dynamic wavelength of a diode laser under the condition of wavelength modulation

Method used

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  • Device and method for dynamic wavelength measurement of diode laser under wavelength modulation
  • Device and method for dynamic wavelength measurement of diode laser under wavelength modulation
  • Device and method for dynamic wavelength measurement of diode laser under wavelength modulation

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Embodiment Construction

[0058] The present invention utilizes the ring cavity optical fiber etalon and the photodetector to realize the interference peak monitoring in the wavelength modulation process of the diode laser, and then adopts the mode of interference peak identification and sinusoidal fitting to invert the laser wavelength dynamic change parameter a 1 , a 2 ,

[0059] Parameter fitting of the present invention is based on the principle of Fourier expansion:

[0060] The time-varying curve of wavelength under sinusoidal voltage modulation with modulation frequency f can be expressed as:

[0061]

[0062] In the formula, a 0 is the DC term, a 1 is the first-order item, a 2 is a second-order term. According to the corresponding relationship between (2) and (3), it can be concluded that if the sine wave with frequency f is used to fit the curve of wavelength changing with time, a can be obtained 1 and Fitting residuals can be expressed as:

[0063]

[0064] If a sine wave w...

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Abstract

The invention relates to adiode laser device dynamic wavelength measuring device and method in wavelength modulation. The device comprises an etalon, an electrophotonic detector, a signal generator and data acquisition and processing equipment. The signal generator is connected with the external modulation end of a diode laser device to generate sinusoidal modulated voltage signals for modulationof the output wavelength of the diode laser device. The input end of the etalon is connected with the exit end of the diode laser device to generate interference intensity signals. The electrophotonicdetector is connected with the output end of the etalon to convert received optical signals into the voltage signals. The method is to inverse laser wavelength dynamic variation parameters a<1>, phi<1>, a<2> and phi<2> by means of interference peak identification and sine fitting, wavelength measurement accuracy can be better than 0.001cm<-1>, the response rate can be better than 25MHz, and the aims of high precision and high response rate of the diode laser device in the wavelength modulation in wavelength measurement are achieved.

Description

technical field [0001] The invention relates to an optical precision measurement technology, in particular to a tunable continuous laser dynamic wavelength measurement device and method. Background technique [0002] Diode lasers are widely used in optical communication, optical sensing, and tunable diode laser absorption spectroscopy (Tunable diode laser absorption spectrum) due to their advantages of small size, low power consumption, long life, narrow linewidth, tunable wavelength, and low price. spectroscopy, TDLAS) and other techniques. In TDLAS measurement technology, in order to improve the detection sensitivity and anti-interference ability, people generally use the wavelength modulation absorption method, that is, the output wavelength of the diode laser changes as a sine wave at a specific frequency, so that the corresponding absorption signal has modulation information of a specific frequency. This facilitates the identification and detection of absorption signal...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02G01M11/00G01J9/02
CPCG01J9/0246G01M11/00
Inventor 陶波胡志云叶景峰张振荣
Owner NORTHWEST INST OF NUCLEAR TECH
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