BOB blind debugging technology-based APC anti-noise method for DFB laser

Abstract

The invention discloses a BOB blind debugging technology-based APC anti-noise method for a DFB laser. The method comprises the steps of writing an initial value of a register; comparing a P0 value with a set value, judging whether an optical power value is within a normal value range or not, if so, completing debugging, if not, judging that the optical power value is larger or smaller, if the optical power value is larger, reducing modulated current, and if the optical power value is smaller, increasing the modulated current; judging whether a DAC is zero or not; increasing a modulated currentvalue, reversely searching the optical power value, comparing the maximum power value with the set value and judging whether the maximum optimal power value is larger or not; and judging whether meanoptical power is within the normal value range, if so, completing debugging and outputting the DAC value and the optical power value. A threshold change caused by a temperature change or laser ageingis overcome, the mean optical power of the laser is kept constant, the problem of an optical power debugging failure caused by board-level noise is solved, the production efficiency and the yield areimproved and the production cost is reduced.

Description

technical field [0001] The invention belongs to the field of laser anti-noise. In particular, it relates to a DFB laser APC anti-noise method based on BOB blind tuning technology. Background technique [0002] BOB technology is an innovation in PON access equipment. Its application saves a lot of cost on hardware and simplifies the system composition and production testing process of ONU terminal equipment. Through BOB technology, on-board testing and calibration, module testing and System testing can be completed quickly, but in actual production debugging, due to the influence of interference and noise, etc., the defect rate of debugging increases, thus affecting production efficiency and production test yield. Contents of the invention [0003] The object of the present invention is to propose a new anti-noise method for APC closed-loop debugging of DFB lasers based on BOB blind tuning technology in view of the above problems. [0004] The DFB laser APC anti-noise met...

AI Technical Summary

Problems solved by technology

[0002] BOB technology is an innovation in PON access equipment. Its application saves a lot of cost on hardware and simplifies the system composition and production testing process of ONU terminal equipment. Through BOB technology, on-board testing and calibration, module testing and The system test can be completed quickly, but in the actual production debugging, due to the influence of interference and noise, etc., the defective rate of debugging increases, thus affecting production efficiency and production test yield

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