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Three-dimensional scanning system and method

A technology of three-dimensional scanning and scanning points, which is applied in the field of optical scanning, can solve the problems of spending a lot of time, not being suitable for high-precision equipment and cultural relics, and the cumbersome process of pasting reflective markers, etc., to achieve high scanning accuracy and expandable working space.

Active Publication Date: 2018-11-13
ZG TECH CO LTD
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  • Application Information

AI Technical Summary

Problems solved by technology

[0002] 3D laser scanners have been able to conveniently solve most of the high-precision measurement tasks that do not require the surface texture of objects, but they must paste a certain number of evenly distributed reflective marker points on the surface of the object to be measured for frame splicing during scanning, while pasting reflective The process of marking points is cumbersome and takes a lot of time, which increases the workload of scanning and measurement, and is not suitable for high-value items such as high-precision equipment and cultural relics that do not allow marking points to be pasted on the surface
However, due to its algorithm mechanism, the accuracy cannot meet the needs of precise measurement

Method used

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Embodiment Construction

[0069] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0070] Such as figure 1 As shown, a three-dimensional scanning system includes a tracking device 1, a scanner 2 and a processor 4, and the surface of the scanner 2 is provided with at least four reference marker points;

[0071] The tracking device 1 is used to obtain the coordinates of the reference marker points in the first coordinate system (X Tj ,Y Tj ,Z Tj )(j=1,2,3...n, and n≥4);

[0072] The scanner 2 is used to scan the target object 3, and obtain the coordinates (X Sk ,Y Sk ,Z Sk )(k=1,2,3...m);

[0073] The processor 4 is used to obtain the coordinates (X) of the reference marker point in the second coordinate system Si ,Y Si ,Z Si ) (i=1,2,3...n, and n≥4), and according to the coordinates of th...

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Abstract

The invention relates to a three-dimensional scanning system and method. The system comprises a tracking device, a scanner and a processor, and a plurality of reference mark points are arranged on thesurface of the scanner; the tracking device acquires first coordinates of the reference mark points within the range of a field of view thereof; the scanner scans a target object to obtain second coordinates of scanning points formed on the surface of the target object; and the processor obtains the second coordinates of the reference mark points, constructs a target object surface in a first coordinate system according to the first coordinates of the reference mark points, the second coordinates of the reference mark points and the second coordinates of the scanning points so as to generatea three-dimensional model of the target object. According to the three-dimensional scanning system provided by the invention, by respectively obtaining the first coordinates of reference reflection points and the second coordinates of the scanning points, and obtaining the first coordinates of the scanning points according to the first coordinates of reference reflection points and the second coordinates of the scanning points, the surface of the target object can be constructed in the first coordinate system so as to generate the three-dimensional model of the target object, and the three-dimensional scanning system is high in scanning precision and is convenient and fast, and the working space can be expanded.

Description

technical field [0001] The invention relates to the technical field of optical scanning, in particular to a three-dimensional scanning system and method. Background technique [0002] 3D laser scanners have been able to conveniently solve most of the high-precision measurement tasks that do not require the surface texture of objects, but they must paste a certain number of evenly distributed reflective marker points on the surface of the object to be measured for frame splicing during scanning, while pasting reflective The process of marking points is cumbersome and takes a lot of time, which increases the workload of scanning and measurement. It is also not suitable for high-value items such as high-precision equipment and cultural relics that do not allow marking points to be pasted on the surface. [0003] The white light scanner in the prior art does not need to stick marker points on the surface of the object to be measured for image positioning and posture determinatio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T17/00
CPCG06T17/00
Inventor 郑顺义王晓南成剑华刘庆龙朱锋博
Owner ZG TECH CO LTD
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