Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System and method for testing internal modules of vector network analyzer

A vector network analysis and testing system technology, applied in the field of the internal module testing system of the vector network analyzer, can solve the problems such as the inability to save the test curves and test parameter pictures, the inability to display the results of the curve images of the quality inspectors, and the inability to automatically generate test reports, etc. , to achieve the effect of saving measurement costs, reducing workload and improving test speed

Inactive Publication Date: 2018-11-13
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
View PDF8 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing technical solutions cannot automatically export measurement data and cannot automatically generate test reports
Existing technical solutions cannot automatically save pictures of test curves and test parameters, and cannot directly display the results of curve images for quality inspectors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System and method for testing internal modules of vector network analyzer
  • System and method for testing internal modules of vector network analyzer
  • System and method for testing internal modules of vector network analyzer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0046] The invention adopts the method of program control vector network analyzer platform, spectrum analyzer, power meter, signal source and other test instruments to realize the connection of the instruments and complete the automatic execution of the test. The whole test system is composed of spectrum analyzer, power meter, signal source and other instruments. The invention adopts the idea of ​​program control, utilizes SCPI commands and operation instructions of various instruments, and uses software to provide program-controlled command import mode, realizes the establishment of a test system, and completes various test functions. Such as figure 2 The test system shown is composed of 5 sub-test systems, namely source isolation test system, mixer isolation test system, source output power test system, harmonic sub-harmonic test system and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a system and method for testing the internal modules of a vector network analyzer and belongs to the technical field of testing. The system comprises a hardware system and a software system, wherein the hardware system comprises a source isolation degree testing system, a mixer isolation degree testing system, a source output power testing system, a harmonic and subharmonictesting system and a pulse switch ratio testing system; the software system comprises a testing parameter setting and testing instrument connecting module, an instrument program control command import module and a testing task executing module. The system has the advantages that the system can automatically adapt to testing instruments such as spectrometers, power meters and signal sources of different factories and types to complete the testing task; the various internal modules of the vector network analyzer can be fast tested, the testing speed of the various internal modules of the vectornetwork analyzer is increased, the production efficiency of the vector network analyzer is increased, testing cost is reduced, and huge economic benefits are achieved.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a testing system and testing method for an internal module of a vector network analyzer. Background technique [0002] The vector network analyzer is composed of signal generating unit, test unit, receiving unit and other unit modules, wherein the signal generating unit includes local oscillator source, excitation source and other modules, and the receiving unit includes mixer unit module, intermediate frequency conditioning unit module and so on. In order to ensure the performance of the vector network analyzer, it is necessary to conduct a comprehensive test on the above-mentioned module indicators inside the vector network analyzer. If these testing tasks are completed by manual testing, the testing cost is huge, laborious and time-consuming, which is not conducive to quality inspection. For example: the source module index test task inside the vector network anal...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R35/00
CPCG01R35/00
Inventor 李明太赵立军李树彪刘丹郭永瑞庄志远袁国平杨明飞蔡洪坤肖波涛
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com