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Parameter mapping-based measurement planning method for complex curved surface

A complex surface and surface technology, applied in the field of complex surface measurement planning based on parameter mapping

Inactive Publication Date: 2018-10-19
DALIAN UNIV OF TECH
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  • Application Information

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Problems solved by technology

[0005] The technical problem mainly solved by the present invention is to overcome the deficiencies of the existing methods, and to meet the high-precision and high-efficiency measurement requirements of complex curved surfaces, a complex curved surface measurement planning method based on parameter mapping is invented.

Method used

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  • Parameter mapping-based measurement planning method for complex curved surface
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  • Parameter mapping-based measurement planning method for complex curved surface

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Embodiment Construction

[0039] The specific implementation of the present invention will be described in detail in conjunction with the accompanying drawings and technical solutions.

[0040] The triangular mesh surface Γ used in this embodiment is a Mexican straw hat surface model, with a total of 1821 nodes and 3512 triangular elements. The size of the smallest bounding box of the mesh model is 160mm×160mm×80mm, the offset distance Δ is 5mm, and the chord height The tolerance is 2mm. First, the grid parameterization method is used to establish the corresponding relationship between the triangular mesh surface and the plane parameter domain, and then the measurement trajectory planning and measurement point distribution are carried out in the plane parameter domain. The basic flow chart is shown in the attached figure 1 . The specific steps of the method are as follows:

[0041] The first step is to parametrize the triangular mesh surface Γ

[0042] The triangular mesh surface Γ is parametrized b...

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Abstract

The invention relates to a parameter mapping-based measurement planning method for a complex curved surface which belongs to the field of precision measurement. In the method, a triangular grid curvedsurface is mapped into a plane parameter domain by adopting a grid parameterization method to form a plane grid model corresponding to the vertex of the triangular grid curved surface and the vertexof the plane parameter domain; a boundary contour of the plane grid model is extracted, boundary contour lines are utilized as guiding line segments, and according to a measurement accuracy requirement, each segment is offset in a normal direction to generate measurement paths covering the entire plane grid model; each measurement path is again inversely mapped to the triangular grid curved surface to obtain curved surface measurement paths; and arranging points on the curved surface measurement paths by using an equal-chord height difference method to complete measurement and planning of thecomplex curved surface. The method enables the measurement efficiency to be improved, and enables the difficulty of the measurement and planning of the complex curved surface to be reduced, and versatility is strong, and requirements of unified processing of curved surface measurement path planning of various models under the same framework can be satisfied.

Description

technical field [0001] The invention belongs to the field of precision measurement, in particular to a method for measuring and planning complex curved surfaces based on parameter mapping. Background technique [0002] Complex curved surfaces are widely used in aerospace, automobile, mold and other fields, and their accurate measurement is an important link to ensure the geometric accuracy of the final machining of parts. In actual measurement, a series of discrete sampling points are often arranged on the surface of the part to obtain complex surface geometry. Therefore, reasonable planning of measurement paths and distribution of measurement points is an important guarantee to meet the requirements of measurement accuracy and efficiency. For parts with complex surface shapes, the method of partition measurement is usually used. However, if the partition is too large, each part of the surface cannot be accurately represented, which will affect the surface reconstruction a...

Claims

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Application Information

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IPC IPC(8): G06T17/00G06F17/50
CPCG06F30/20G06T17/00
Inventor 刘海波袭萌萌祝雪峰廉盟刘天然隋延飞孟祥振刘阔王永青贾振元
Owner DALIAN UNIV OF TECH
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