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Probe module and lighting test system

A probe and contact technology, applied in the field of lighting test systems, can solve problems such as shortening the life of the probe module, poor electrical properties of the display panel, and damage to the display panel circuit, and achieves the effect of reducing product defects, production defects, and impact.

Active Publication Date: 2021-08-31
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, due to the relatively precise internal wiring between the probe module and the display panel, once a circuit short circuit occurs during the lighting test, it may cause damage to the probe module or the display panel circuit, shorten the life of the probe module or cause electrical failure of the display panel

Method used

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  • Probe module and lighting test system
  • Probe module and lighting test system
  • Probe module and lighting test system

Examples

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Embodiment Construction

[0036] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar structures, and thus their detailed descriptions will be omitted.

[0037] Although relative terms such as "upper" and "lower" are used in this specification to describe the relative relationship of one component of an icon to another component, these terms are used in this specification only for convenience, for example, according to the description in the accompanying drawings directions for the example described above. It will be appreciated that if the illustrated device is turned over so...

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Abstract

The present disclosure provides a probe module and a lighting test system, which relate to the field of panel testing. The probe module of the present disclosure includes: a plurality of probes; a plurality of first lines, which are respectively connected to the probes; and a plurality of second lines, which are connected to the lighting signal source and correspond to the first lines one-to-one set; a resistance measurement unit, used for measuring the resistance between the first lines when connected with the plurality of first lines; a control unit, connected with the first line, the second line and the resistance measurement unit, is used to control the resistance measurement unit to communicate with the plurality of first lines when the probe is connected to the contacts of the display panel, and to control the plurality of first lines when the resistance between the first lines satisfies a preset condition A second line is in communication with the plurality of first lines correspondingly. The present disclosure can avoid damage to probes or display panel lines due to short-circuit phenomena.

Description

technical field [0001] The present disclosure relates to the technical field of panel testing, and in particular, to a probe module and a lighting test system including the probe module. Background technique [0002] With the development of optical technology and semiconductor technology, flat panel displays represented by liquid crystal display panels and organic light emitting diode display panels have been widely used in the display field. [0003] In the manufacturing process of flat panel displays, there are usually multiple inspection procedures to detect defects in the process in time. Taking the liquid crystal display panel as an example, a lighting test needs to be performed after the display panel is assembled into a box. During the lighting test process, each data (Data) signal and gate (Gate) signal needs to be separately transmitted to each corresponding contact (Pad) on the display panel through the lighting test system. In the specific detection, the probes ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 陈长鹤朱忠发吴松葛徐涛
Owner BOE TECH GRP CO LTD
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