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Sensing element for a measurement system suitable for dielectric impedance spectroscopy

A sensing element and measurement system technology, applied in dielectric property measurement, resistance/resistance/impedance measurement, material analysis through electromagnetic means, etc., can solve problems such as complex and unattractive measurement settings, and achieve simple and The effect of fast installation, accurate measurement, and good signal-to-noise ratio

Inactive Publication Date: 2018-06-08
SIEMENS AG OESTERR
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  • Application Information

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Problems solved by technology

However, both the measurement setup and the execution of this measurement become very complex
[0008] Other methods of dielectric impedance spectroscopy also appear unattractive, especially in combination with suspended solids to be measured

Method used

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  • Sensing element for a measurement system suitable for dielectric impedance spectroscopy
  • Sensing element for a measurement system suitable for dielectric impedance spectroscopy
  • Sensing element for a measurement system suitable for dielectric impedance spectroscopy

Examples

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Embodiment Construction

[0052] figure 1 The structure of the sensing element 1 according to the invention is shown. In this case, the shown schematic structure of such a sensing element 1 firstly comprises a first printed circuit board 4 . The first conductor strip 3 and the first ground surface 5 are arranged on opposite outer surfaces 8 , 9 of the printed circuit board 4 and connected to said printed circuit board 4 . The conductor strip 3, the first printed circuit board 4 and the first ground surface 5 together form the first microstrip conductor 2 of the sensing element 1, wherein the first printed circuit board 4 forms the first dielectric of the first microstrip conductor 2. base.

[0053] figure 2 A first specific exemplary embodiment of a sensing element 1 according to the invention is shown. The sensing element 1 according to the exemplary embodiment comprises a first microstrip conductor 2 for a measurement signal and a second microstrip conductor 10 for a reference signal.

[0054] ...

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Abstract

A sensing element (1) for a measurement system suitable for dielectric impedance spectroscopy, wherein the sensing element (1), at least in one operating state of the sensing element (1), comprises atleast first one microstrip conductor (2), consisting of a first conductor strip (3) for a measurement signal, a first dielectric substrate and a first ground surface (5), wherein the first conductorstrip (3) may be applied from the outside and over an area to a container containing a dielectric material sample to be measured, preferably to a pipe, a vessel or a bag.

Description

technical field [0001] The invention relates to a sensing element for a measuring system suitable for dielectric impedance spectroscopy. [0002] The invention further relates to a measuring system for dielectric impedance spectroscopy comprising a sensing element according to the invention and a device for generating and evaluating a measurement signal and / or a reference signal for the sensing element. [0003] Finally, the invention also relates to a method for determining the impedance of a sample of dielectric material, preferably a dielectric suspension, contained in a container by means of a measuring system according to the invention. Background technique [0004] Many suspended solids, such as those commonly found eg in biotechnology and industrial fields or also in oil exploration, are measured and characterized by means of dielectric impedance spectroscopy. This is usually only possible with contact-based measurements, where the sensing element is in contact with ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/02
CPCG01N27/00G01N27/02G01N27/026G01N27/028G01R27/2617G01R27/2623G01R27/2635G01R27/2647G01R27/2652
Inventor M.贾恩M.施伊弗
Owner SIEMENS AG OESTERR
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