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Method, device and system for calculating laser processing system technological parameters

A technology of process parameters and laser processing, which is applied in computing, laser welding equipment, metal processing equipment, etc., can solve the problems of low accuracy of parameter combination, lack of objective and scientific methods, and inaccurate orthogonal factor level tables, etc.

Active Publication Date: 2018-05-15
GUANGDONG ZHENGYE TECH
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Problems solved by technology

[0004] At present, in the field of laser marking, the orthogonal experiment method is usually used to optimize the parameter combination. However, in the early stage of the orthogonal experiment, the factor level is usually determined based on manual experience and the orthogonal factor level table is formulated. There is a lack of objective and scientific methods. Make the determined factor level and the formulated orthogonal factor level table inaccurate, resulting in low accuracy of the finally sought parameter combination, thereby affecting the pattern quality

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  • Method, device and system for calculating laser processing system technological parameters
  • Method, device and system for calculating laser processing system technological parameters
  • Method, device and system for calculating laser processing system technological parameters

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Embodiment Construction

[0061] Embodiments of the present invention provide a method, device, and system for calculating process parameters of a laser processing system, which improve the accuracy of factor levels, factor level tables, and orthogonal tables, thereby improving the accuracy of optimal process parameter combinations, and The quality of the pattern engraved under the optimal process parameter combination is improved.

[0062] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative...

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Abstract

The embodiment of the invention discloses a method, device and system for calculating laser processing system technological parameters. The method for calculating the laser processing system technological parameters includes the steps of adopting a control variable method and various initial values to determine all first good intervals which are in one-to-to correspondence with all influence factors, wherein all the initial values correspond to all the influence factors; adopting a golden section method to determine factor levels which correspond to all the influence factors respectively fromall the first good intervals; according to all the factor levels, establishing a factor level list and a orthogonal form, and according to the factor level list and the orthogonal form, carrying out an orthogonal experiment for the first time to obtain first experiment results; according to the first experiment results, determining characteristics of all the influence factors and all good levels,wherein all the good levels are in one-to-one correspondence with all the influence factors; according to the characteristics of all the influence factors and all the good levels, determining an optimal technical parameter combination. By the adoption of the method, device and system for calculating the laser processing system technological parameters, the accuracy of the factor levels, the accuracy of the factor level list and the accuracy of the orthogonal form are improved, and therefore the accuracy of the optimal technical parameter combination is improved.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of laser processing, in particular to a method, device and system for calculating process parameters of a laser processing system. Background technique [0002] Finding the optimal parameter combination is a problem often faced in industrial production and scientific research. When multiple parameters affect the experimental results at the same time, use scientific experimental methods to find the optimal parameters that meet the requirements of industrial production and scientific research while minimizing the number of experiments. The optimal parameter combination is of great significance. [0003] Laser marking technology is one of the largest application areas of laser processing. Laser marking is a marking method that uses a high-energy-density laser to locally irradiate the workpiece to vaporize the surface material or undergo a chemical reaction of color change, thereby leaving...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50B23K26/362
CPCB23K26/361G06F2111/06G06F30/00
Inventor 肖磊卢相安梅领亮徐地华
Owner GUANGDONG ZHENGYE TECH
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