Sample detection system and sample detection method

A technology for sample detection and microscopic examination, applied in the field of medical devices, can solve problems such as affecting detection accuracy, and achieve the effect of improving detection accuracy

Active Publication Date: 2018-03-09
AVE SCI & TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Based on this, it is necessary to provide a sample detection system and a sample detection method with a larger sample detection range and higher detection accuracy for the problem that the sample detection range is small and affects the detection accuracy.

Method used

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  • Sample detection system and sample detection method
  • Sample detection system and sample detection method

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Embodiment Construction

[0035] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0036] It should be noted that when an element is said to be "fixed" to another element, it may be directly on the other element or there may be an element in between. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or there may be both elements in between.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understoo...

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Abstract

The invention discloses a sample detection system and a sample detection method. The sample detection system comprises a third conveyer device and a microscopic examination device, wherein the microscopic examination device comprises a microscopic examination platform and a lens, and a microscopic examination position is arranged on the microscopic examination platform; the third conveyer device is used for conveying a carrier to the microscopic examination position of the microscopic examination platform of the microscopic examination device and pushing the carrier away from the microscopic examination position; the microscopic examination position of the microscopic examination platform can move in a first direction and a second direction so as to adjust the position of the microscopic examination position relative to the lens, and the lens is used for sampling the carrier on the microscopic examination position. According to the sample detection system and the sample detection method, the position of the microscopic examination position relative to the lens is adjusted during image acquisition, the image acquisition of the lens at a plurality of different positions is facilitated, the detection for images of samples in a relatively large range is acquired, and acquired images can reflect the true situation of the samples relatively accurately, so that the detection accuracyis improved.

Description

technical field [0001] The invention relates to the technical field of medical devices, in particular to a sample detection system and a sample detection method. Background technique [0002] When testing a patient, it is sometimes necessary to test the patient's sample to be tested (such as stool, urine, semen, leucorrhea, etc.). Graph to test the sample. Usually, the range that a microscope can detect is small, so only a small range of samples can be detected, and the small range of samples sometimes cannot fully represent the entire sample, resulting in low detection accuracy, which in turn affects the accuracy of disease detection . Contents of the invention [0003] Based on this, it is necessary to provide a sample detection system and a sample detection method with a larger detection range of reduced samples and higher detection accuracy for the problem that the sample detection range is small and affects the detection accuracy. [0004] A sample detection system...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84G01N21/01
CPCG01N21/01G01N21/84G01N2021/0112G01N21/13
Inventor 丁建文
Owner AVE SCI & TECH CO LTD
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