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Method for eliminating axial distance error between object and CCD through self-focusing iterative algorithm

An axial distance, iterative algorithm technology, applied in the field of optical algorithms, can solve the problem of unresolved image reconstruction, and achieve the effect of fast calculation speed, clear algorithm, and compact optical path.

Active Publication Date: 2018-02-02
NANJING UNIV OF SCI & TECH
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Problems solved by technology

However, it does not solve the problem of the influence of axial distance on the reconstructed image

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  • Method for eliminating axial distance error between object and CCD through self-focusing iterative algorithm
  • Method for eliminating axial distance error between object and CCD through self-focusing iterative algorithm
  • Method for eliminating axial distance error between object and CCD through self-focusing iterative algorithm

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Embodiment Construction

[0021] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0022] combine figure 1 , figure 2 and image 3 , the present invention proposes a method for eliminating the axial distance error between the object and the CCD using the self-focusing iterative algorithm. In the stack imaging process, the axial distance error between the object plane and the CCD target surface will introduce discreteness Error, the specific method steps are as follows:

[0023] Step 1. Construct the stack imaging optical path model:

[0024] The common optical axis is set in turn with He-Ne laser, variable aperture 1, lens 2, object under test 3 and CCD4. The light behind the diaphragm 1 is converged by the lens 2 into a diverging spherical wave, that is, the illumination light, and irradiates the surface of the object under test 3. The object under test 3 is fixed on the two-dimensional electric displacement stage by the holder and th...

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Abstract

The invention discloses a method for eliminating axial distance error between an object and a CCD through a self-focusing iterative algorithm. The method comprises the following steps: establishing anaxial distance error model through a Fresnel diffraction theory, and calculating axial distance through measurement of resolution of amplitude of a restored object, that is, in the laminated imagingprocess, transmitting reconstructed images to axial-distance-different planes through Fresnel diffraction integral and calculating a Tamura coefficient at each plane, the Tamura coefficients being resolution evaluation indexes, and when the Tamura coefficient reaches a maximum value, the generated restored image being clearest; and serving the axial distance corresponding to the place as a new axial distance for the next iteration, and repeating the process until the axial distance converges, and thus accurate axial distance is obtained. The method is good in correction effect for the axial distance errors in the laminated imaging process, is fast in operation speed and is high in image restoration resolution; and the method can be applied to the field of biological microscopy and opticaltest and the like.

Description

technical field [0001] The invention belongs to the field of optical algorithms, in particular to a method for eliminating the axial distance error between an object and a CCD by using a self-focusing iterative algorithm. Background technique [0002] Stacked Imaging Technology (PIE) is a lensless imaging technology that overcomes the shortcomings of traditional Coherent Diffraction Imaging (CDI), which have high requirements for restoring samples, limited imaging field of view, and inability to restore slightly complex samples. Laminated imaging technology has a series of outstanding advantages such as fast convergence speed, large field of view, and high reliability. It has achieved success in visible light, X-ray and electron beam imaging and has had a greater impact in the field of high-resolution imaging. The ePIE improved by PIE can reconstruct the distribution of the object and the illumination light at the same time only by using the far-field diffraction spot of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/00
Inventor 马骏张天宇窦建泰魏聪
Owner NANJING UNIV OF SCI & TECH
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