Converted wave surface element mapping fast CCP gather extraction method
A wave surface element and fast technology, applied in the field of converted wave surface element mapping fast CCP gathers, can solve the problems of difficult calculation, complex analysis of converted wave velocity, unsatisfactory CCP gather method, etc., to achieve fast and accurate extraction Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029] Preferred embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although preferred embodiments of the invention are shown in the drawings, it should be understood that the invention may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
[0030] Here, the basic principle of the present invention is briefly introduced. figure 1 (a) is an exemplary bin mapping plan according to the present invention; figure 1 (b) is an exemplary bin mapping profile according to the present invention, S is the source point, and R is the receiving point. The inventor considers combining the imaging of the input channel and the output channel, adopts a parallel algorithm, and arranges different ranges of imaging bi...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com