A quantum tiltmeter based on atomic interference
A technology of atomic interference and inclinometer, applied in the direction of measuring inclination, instruments, measuring devices, etc., can solve problems such as inability to achieve high-precision absolute inclination measurement, and achieve the effect of accurate measurement, high stability, and simplified experimental devices
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[0019] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0020] In view of the shortcomings of the prior art, the present invention proposes a quantum inclinometer that can realize high-precision absolute measurement of inclination. At the same time, the present invention can realize inclination measurement in two-dimensional directions. Compared with the inclination measurement in one-dimensional direction, the two-dimensional direction The tilt measurement only needs to change the optical pulse configuration, which greatly simplifies the experimental setup.
[0021] The invention relates to the technical field of atomic interference measurement inertia...
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