Improved CBFM (Characteristic Basis Function Method)-based method for fast solving target monostatic electromagnetic scattering characteristics
A technology of electromagnetic scattering characteristics and targets, which is applied in the field of rapid analysis of target single-station electromagnetic scattering characteristics, can solve the problems of reduced matrix storage and solution difficulties, long singular value decomposition time, and increased number of basis functions, etc., to reduce the number of generation, calculation Accuracy assurance, quantity reduction effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0019] specific implementation plan
[0020] Step 1: According to the basic principle of the method of moments (MoM), the continuous integral equation of the target surface obtained by the analysis of the basic electromagnetic field theory is discretized into a matrix equation.
[0021] ZJ=V (1)
[0022] where Z ∈ C N×N is the impedance matrix, V∈C N×N is the incident plane wave excitation, J represents the corresponding coefficient matrix, and N represents the number of unknown quantities.
[0023] Step 2: According to the principle of characteristic basis function method (CBFM), block the entire conductor target surface, assuming that the target is divided into M sub-domains, each block is solved as an independent sub-domain, and finally each sub-domain is calculated The obtained surface currents are linearly combined to obtain the current information of the entire target surface.
[0024] For each subdomain, the characteristic basis functions (CBFs) are obtained by:
...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com