Analog electronics digit electric experiment platform capable of artificially setting fault

Abstract

The invention discloses an analog electronics digit electric experiment platform capable of artificially setting faults; the analog electronics digit electric experiment platform comprises a host machine, a serial port converter module and a TTL level conversion module connected in sequence; the output end of the TTL level conversion module is connected with singlechips; each singlechip is connected with an analog multipath selector; each analog multipath selector is connected with an experiment circuit experiment platform wrapper board; the host machine sends a data packet to the singlechip, the singlechip compares a second character with a machine number, if the machine number complies with the second character, the singlechip receives the data and sends a feedback signal to the host machine; the singlechip controls to open and close the analog multipath selector according to the received data, controls experiment platform wrapper board experiment circuit nodes to connect / disconnect, thus simulating various faults; conversely, the singlechip rejects to receive the data. The analog electronics digit electric experiment platform can reserve existing experiment box experiment functions, and allows the experiment process to be closer to the real circuit construction and debug.

Description

technical field [0001] The invention relates to the field of serial port communication, more specifically, relates to an analog-electrical-digital-electrical experiment platform which can artificially set faults. Background technique [0002] Analog and digital electricity experiments are important experimental courses for undergraduate students majoring in electricity. Analog circuit experiment projects: single-stage amplifier design, multi-stage amplifier design, power amplifier design, integrated operational amplifier application design, waveform generator, filter design, etc. Digital circuit experiment projects: TTL integrated gate circuit transmission characteristic test, combinational logic circuit design, sequential logic circuit design, counter design, signal generator, sequence signal generator, 555 timer application, D / A, A / D converter, etc. . Course design projects: temperature controller design, DC regulated power supply design, bridge amplifier design, frequen...

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to provide a serial port communication system to overcome the shortcomings of the existing analog and digital experiment boxes that do not have networking functions and rigid experimental items, and to transform the traditional analog and digital experiment boxes to realize human-configurable The analog-electricity-digital-electricity experimental platform with fault function turns the passive repetitive verification experiment into an analytical experiment full of uncertainties. On the basis of retaining the experimental function of the original experiment box, it trains students to analyze and solve problems. The ability to make the experimental process closer to the actual circuit construction and debugging improves students' learning interest and learning enthusiasm

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