Calibration method of double-probe flying probe testing device

Abstract

The invention discloses a calibration method of a double-probe flying probe testing device. The method comprises the steps of obtaining a first coordinate of a fixed probe when the probe rotates for 0 degree from an original point of a rotating shaft thereof, a second coordinate while rotating for 90 degrees, and a third coordinate while rotating for 180 degrees; obtaining a fourth coordinate of a mobile probe when its distance to the fixed probe is an initial distance, and a fifth coordinate when its distance to the fixed probe is a preset distance; obtaining coordinates of a camera unit; obtaining the distance from the fixed probe to the camera unit when the distance between the fixed probe and the mobile probe is a first distance and the included angle between the connection line of the fixed probe and the mobile probe and the X axis is a first angle according to the first coordinate, the second coordinate, the third coordinate, the fourth coordinate, the fifth coordinate and the coordinate of the camera unit; and calibrating the double-probe flying probe testing device according to the distance from the fixed probe to the camera unit. Therefore, calibration of positions of double probes is achieved, and the condition that the double probes can accurately stab corresponding points on a tested circuit board is ensured.

Description

technical field [0001] The invention relates to the technical field of circuit board testing, in particular to a calibration method for a double-probe flying probe testing device. Background technique [0002] Flying probe test is a circuit board testing technology. Specifically, two probes are simultaneously contacted with two terminals on the circuit board and energized, and the open-short circuit is judged according to the obtained electrical quantity. figure 1 It is a schematic diagram of an existing probe, wherein each probe has only one probe and a CCD camera, and the CCD and the circuit board under test can be observed through the CCD to achieve precise positioning of the CCD and the circuit board under test. The precise positioning of the needle and the circuit board under test must obtain the positional relationship between the CCD and the probe. In order to obtain the positional relationship between the CCD and the probe, you can find the center of the disc by pie...

AI Technical Summary

Problems solved by technology

[0004] Therefore, the technical problem to be solved by the present invention is that existing single-probe testing techniques are not efficient, and existing calibration methods are not suitable for probes with multiple probes

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