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A Femtosecond Electron Diffraction Device Accelerated by Terahertz Driven Electron Pulses

A technology of terahertz pulses and electronic pulses, which is applied in the field of femtosecond electron diffraction devices, can solve the problems of limited time jitter, large electron energy, and high cost, and achieve the effects of eliminating time jitter, large acceleration gradients, and compact devices

Active Publication Date: 2017-12-01
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, similar to the RF compression femtosecond electron diffraction device, the time resolution of the traditional MeV femtosecond electron diffraction device is severely limited by the time jitter between the pump laser and the probe electron, which is about 130fs
At the same time, due to the high energy of electrons, it may cause damage to the sample
In addition, the device involves accelerator-related technologies, with complex structure, huge volume and high cost

Method used

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  • A Femtosecond Electron Diffraction Device Accelerated by Terahertz Driven Electron Pulses
  • A Femtosecond Electron Diffraction Device Accelerated by Terahertz Driven Electron Pulses
  • A Femtosecond Electron Diffraction Device Accelerated by Terahertz Driven Electron Pulses

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Embodiment Construction

[0040] The purpose of the present invention is to realize a femtosecond electron diffraction device accelerated by terahertz-driven electron pulses, which solves the problems of further improvement of the acceleration field gradient of the current typical device, more compact and flexible, and higher time resolution. The device uses a terahertz field instead of a radio frequency acceleration field or a DC acceleration field, does not require a radio frequency module, is easy to implement, has better synchronization, a more compact structure, a higher acceleration field strength (up to 200MV / m) and more Low cost, can operate in reflection or transmission mode, can conduct research on reversible and irreversible processes, and has both high brightness and high temporal and spatial resolution.

[0041] Such as figure 1 As shown, the device includes a femtosecond laser 1, a beam splitter 2, a mirror 45, an ultraviolet laser pulse generating device 3, a terahertz pulse generating d...

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Abstract

The invention relates to a terahertz-driven electronic pulse accelerating femtosecond electron diffraction device which comprises a femtosecond laser, a beam splitter, an ultraviolet laser pulse generator, a terahertz pulse generator, an electron gun, an electron focusing device, a sample room, an imaging device and a camera. After the femtosecond laser emitted by the femtosecond laser passes through the beam splitter, one beam of femtosecond laser enters the ultraviolet laser pulse generator, and the other beam of femtosecond laser enters the terahertz pulse generator through a mirror. An ultraviolet laser pulse and a terahertz pulse received by the electron gun enter the cavity of the electron gun to produce an electronic pulse. The electron focusing device is mounted between the cavity of the electron gun and the sample room. A sample assembly and the imaging device are placed inside the sample room in sequence along the emitting direction of the electronic pulse. The camera is placed at a position, facing the imaging device directly, outside the sample room. The device can run in a reflection or transmission mode, can be used in research of both a reversible process and an irreversible process, and is of high brightness and high spatial-temporal resolution.

Description

technical field [0001] The invention belongs to the technical field of time-resolved electron diffraction, and in particular relates to a femtosecond electron diffraction device for terahertz-driven electron pulse acceleration. Background technique [0002] Electrons have been continuously researched and applied by scientists since they were discovered by J.J. Thomson experiment in 1897. In 1924, de Broglie predicted that moving electrons also have wave properties, and their wavelength is λ=h / mv. Just three years later (1927), two studies were completed by G.P. Thomson and C.J. Davidson-L.H. Germer respectively. Three independent electron diffraction experiments have confirmed the wave nature of electrons (milestone nodes), which laid the foundation for the use of electrons to probe the structure of matter. Since then, electrons have appeared on the historical stage in the form of probes. With the help of the femtosecond laser in the 1980s, Williamson et al. completed the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J37/295H01J37/06
CPCH01J37/06H01J37/295
Inventor 罗端田进寿惠丹丹王兴温文龙
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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