Method and device for locating defects

A defect and software program technology, applied in the computer field, can solve the problems of not applicable to scenarios with a large amount of source code, low static analysis efficiency, and high method complexity

Active Publication Date: 2019-03-22
NEUSOFT CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the method of static analysis is inefficient and not suitable for scenarios with a large amount of source code
The method of establishing the training set is relatively complex and insensitive to high-risk defects

Method used

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  • Method and device for locating defects
  • Method and device for locating defects
  • Method and device for locating defects

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Embodiment Construction

[0059] Specific embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present disclosure, and are not intended to limit the present disclosure.

[0060] Please refer to figure 1 , figure 1 It is a flowchart of a method for locating a defect according to an exemplary embodiment. like figure 1 As shown, the method includes the following steps:

[0061] Step S11: extracting abnormal stack data from the running log file of the software program;

[0062] Step S12: According to the abnormal stack data, determine the defect parameters, the defect parameters include: the number of occurrences of the method in which the defect occurred in the software program, the number of occurrences of the method calling the method in which the defect occurred, and the The number of times the flawed method was called; ...

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Abstract

The invention discloses a defect positioning method and a defect positioning device. The method comprises the following steps: extracting abnormal stack data from an operating log file of a software program; generating a network topology map according to the abnormal stack data, wherein the network topology map represents the historical defect condition of the software program; and determining the high-risk defect in the software program according to the network topology map. The defect is positioned by the operating log file without analyzing all the source codes, so the defect positioning complexity is reduced; furthermore, by virtue of the network topology map, the high-risk defect can be identified accurately and the defect positioning efficiency is improved.

Description

technical field [0001] The present disclosure relates to the field of computers, and in particular, to a method and device for locating defects. Background technique [0002] With the development of information technology, more and more software programs are running on computers. In order to ensure that the software program can run normally on the computer, before releasing the software program, the programmer will detect whether there is a defect in the software program, and if there is a defect in the software program, modify the software program until there is no defect in the software program . Then release the bug-free software program. [0003] In related technologies, it is possible to statically analyze the source code of the software program or establish a training set to detect whether there is a defect in the software program. However, the method of static analysis is inefficient and not suitable for scenarios with a large amount of source code. The method of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3612
Inventor 谢新强张德阳
Owner NEUSOFT CORP
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